ATxmega32A4 Atmel Corporation, ATxmega32A4 Datasheet - Page 338
ATxmega32A4
Manufacturer Part Number
ATxmega32A4
Description
Manufacturer
Atmel Corporation
Specifications of ATxmega32A4
Flash (kbytes)
32 Kbytes
Pin Count
44
Max. Operating Frequency
32 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
34
Ext Interrupts
34
Usb Speed
No
Usb Interface
No
Spi
7
Twi (i2c)
2
Uart
5
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
12
Adc Resolution (bits)
12
Adc Speed (ksps)
2000
Analog Comparators
2
Resistive Touch Screen
No
Dac Channels
2
Dac Resolution (bits)
12
Temp. Sensor
Yes
Crypto Engine
AES/DES
Sram (kbytes)
4
Eeprom (bytes)
1024
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
Yes
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.6 to 3.6
Operating Voltage (vcc)
1.6 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
5
Output Compare Channels
16
Input Capture Channels
16
Pwm Channels
16
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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28.3
8077H–AVR–12/09
TAP - Test Access Port
When using the JTAG interface for Boundary-scan, the JTAG TCK clock frequency can be
higher than the internal device frequency. The System Clock in the device is not required for
Boundary-scan.
The JTAG interface is accessed through four of the AVR's pins. In JTAG terminology, these pins
constitute the Test Access Port - TAP. These pins are:
The IEEE std. 1149.1-2001 also specifies an optional TAP signal; TRST - Test ReSeT. This is
not available.
When the JTAGEN Fuse is unprogrammed or the JTAG Disable bit is set the JTAG interface is
disabled. The four TAP pins are normal port pins and the TAP controller is in reset. When
enabled, the input TAP signals are internally pulled high and the JTAG is enabled for Boundary-
scan operations.
Figure 28-1. TAP Controller state diagram
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
• TCK: Test Clock. JTAG operation is synchronous to TCK.
• TDI: Test Data In. Serial input data to be shifted in to the Instruction Register or Data Register
• TDO: Test Data Out. Serial output data from Instruction Register or Data Register.
machine.
(Scan Chains).
XMEGA A
338
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