LQ215M1LGN2 Sharp Electronics, LQ215M1LGN2 Datasheet - Page 20

• Manufacturer Part Number: LQ215M1LGN2
• Manufacturer: Sharp Electronics

Specifications of LQ215M1LGN2

• Lead Free Status / Rohs Status: Supplier Unconfirmed

13．Reliability test items
No
10
1
2
3
4
5
6
7
8
9
【Note 1】Pass: Normal display image with no obvious non-uniformity and no line defect.
【Note 3】The MTBF calculation is based on the assumption that the failure rate distribution meets the
【Note 2】Evaluation should be tested after storage at room temperature for two hour.
High temperature storage test
Test item
Low temperature storage test
High temperature
& high humidity operation test
High temperature operation test
Low temperature operation test
Vibration test
(non- operating)
Shock test
(non- operating)
Thermal shock test
(Storage)
ESD test
MTBF Demonstration
Fail: No display image, obvious non-uniformity, or line defects.
Exponential Model, and B/L is not included.
Partial transformation of the module parts should be ignored.
Vibration level : 1.5G
Bandwidth : 10-300Hz
Waveform : sine wave,
Sweep rate : 10min
30 min for each direction X, Y, Z
(1.5 Hrs in total)
Shock level : 50G, 11ms
Waveform : Half sine wave
Direction : ±X, ±Y, ±Z
One time each direction
-20℃～60℃
25,000 hours with confidence level 90%
Conditions
-20℃, 240h
40℃, 90%RH, 240h
(No condensation)
0℃, 240h
1Hr, 1Hr, 100cycles
60℃, 240h
50℃, 240h
Contack : +/-8kV, 150pF(330ohm)
10times/1point, time/1 sec, total 16 points
Air discharge : +/-15kV, 150pF(330phm)
10times/1point, 1time/1 sec, total 9 points
Judgment
Note 1
Note 1
Note 1
Note 1
Note 1
Note 1
Note 1
Note 1
Note 1
Note 1
LD-22112-17
Remark
Note 2
Note 2
Note 2
Note 2
Note 2
Note 2
Note 2
Note 2
Note 2
Note 3