TDA5230XT Infineon Technologies, TDA5230XT Datasheet - Page 98

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TDA5230XT

Manufacturer Part Number
TDA5230XT
Description
Manufacturer
Infineon Technologies
Datasheet

Specifications of TDA5230XT

Operating Temperature (min)
-40C
Operating Temperature (max)
105C
Operating Temperature Classification
Industrial
Product Depth (mm)
4.4mm
Product Length (mm)
9.7mm
Lead Free Status / Rohs Status
Compliant
2.4.12
Figure 46
The Wake Up Generation Unit is used only in the Self Polling Mode for the detection of
a predefined wake up criterion in the received pattern. All SFRs configuring the Wake Up
Generation Unit support the dual configuration capability (Config A and B). The search
for wake up criteria is started if symbol synchronization is given within the duration of four
symbols (RUNIN); otherwise the wake up search is aborted. During the observation
period, the wake up search is aborted immediately if symbol synchronization is lost. If
this is not the case, the wake up search will last for the number of chips defined in the
register WUBCNT.
The Wake Up Window (WUW) Chip Counter counts the number of received chips and
compares this number vs. the number of chips defined in the register WUBCNT.
The Code Violation Detector checks the incoming chip data stream for being manchester
coded. A Code Violation is given if three consecutive chips are ’One’ or ’Zero’
Data Sheet
Chip Data Clock
Chip Data
SSync Search Time Elapsed
SSync
WUBCNT
WUPAT0
WUPAT1
WUC
Wake Up Generation Unit
Wake Up Generation Unit
0
3
16-chips Shift Register
2
Wakeup Window
Code Violation Detector
Pattern Detector
Chip Counter
Bit Change Detector
16
94
15
Code Violation Detected
Bit Change Detected
WUW Chip Counter
Pattern Detected
Elapsed
Functional Description
Version 4.0, 2007-06-01
Generation
Wakeup
FSM
TDA523x
WU
No WU

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