CAT25C64S-TE13 ON Semiconductor, CAT25C64S-TE13 Datasheet - Page 2

• Manufacturer Part Number: CAT25C64S-TE13
• Manufacturer: ON Semiconductor

Specifications of CAT25C64S-TE13

• Density: 64Kb
• Interface Type: Serial (SPI)
• Organization: 8Kx8
• Access Time (max): 250ns
• Frequency (max): 3MHz
• Write Protection: Yes
• Data Retention: 100Year
• Operating Supply Voltage (typ): 3.3/5V
• Package Type: SOIC
• Operating Temp Range: 0C to 70C
• Supply Current: 10mA
• Operating Supply Voltage (min): 2.5V
• Operating Supply Voltage (max): 6V
• Operating Temperature Classification: Commercial
• Mounting: Surface Mount
• Pin Count: 8
• Lead Free Status / Rohs Status: Not Compliant

Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) These parameter are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
(5) Maximum standby current (I
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
CAT25C32/64
Doc. No. 1001, Rev. J
CC
CC
Symbol
Symbol
I
N
V
LTH
T
voltage on output pins is V
and JEDEC test methods.
I
I
I
I
I
V
V
V
V
V
V
Respect to V
Capability (Ta = 25 C) ................................... 1.0W
CC1
CC2
SB
LI
LO
END
ZAP
with Respect to V
DR
IL
IH
OL1
OH1
OL2
OH2
= +1.8V to +6.0V, unless otherwise specified.
(3)(4)
(5)
(3)
(3)
(3)
(3)
(3)
Power Supply Current
(Operating Write)
Power Supply Current
(Operating Read)
Power Supply Current
(Standby)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
Endurance
Data Retention
ESD Susceptibility
Latch-Up
SS
1)
................... –2.0V to +V
SS ................................
Parameter
Parameter
CC
SB
+0.5V, which may overshoot to V
(2)
) = 10 A for the Automotive and Extended Automotive temperature range.
........................ 100 mA
–2.0V to +7.0V
CC
V
V
V
CC
CC
+2.0V
CC
Min.
-1
x 0.7
- 0.8
-0.2
CC
1,000,000
+2.0V for periods of less than 20 ns.
2
Limits
Typ.
2000
Min.
100
100
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
V
V
CC
CC
Max.
0.4
0.2
10
2
1
2
3
+ 0.5
x 0.3
Max.
Units
CC
mA
mA
V
V
V
V
V
V
A
A
A
+1V.
Characteristics subject to change without notice
V
SO=open; CS=Vss
V
F
CS = V
V
V
CS = 0V
1.8V V
I
I
OL
OH
© 2005 by Catalyst Semiconductor, Inc.
CLK
CC
CC
IN
OUT
4.5V V
I
I
Test Conditions
= 150 A
OL
OH
= -100 A
= V
= 5V @ 10MHz
= 5.0V
= 10MHz
= 0V to V
= 3.0mA
CC
SS
= -1.6mA
CC
Cycles/Byte
<2.7V
or V
CC
Years
Units
Volts
mA
<5.5V
CC
CC
,