TDA8356 NXP Semiconductors, TDA8356 Datasheet - Page 7

• Manufacturer Part Number: TDA8356
• Manufacturer: NXP Semiconductors

Specifications of TDA8356

• Lead Free Status / Rohs Status: Compliant

Philips Semiconductors
Notes
1. The linearity error is measured without S-correction and based on the same measurement principle as performed on
2. Related to V
3. The V values within formulae relate to voltages at or across relative pin numbers, i.e. V
4. V
5. Frequency response V
6. At V
1999 Sep 27
Guard circuit
I
V
SYMBOL
O
O(guard)
DC-coupled vertical deflection circuit
the screen. The measuring method is as follows: Divide the output signal I
from 1 to 22 inclusive. Measure the value of two succeeding parts called one block starting with part 2 and 3 (block 1)
and ending with part 20 and 21 (block 10). Thus part 1 and 22 are unused. The equations for linearity error for
adjacent blocks (LEAB) and linearity error for not adjacent blocks (LENAB) are given below:
pins 7 and 4 divided by voltage value across pins 1 and 2.
LEAB
9-4
(ripple)
AC short-circuited.
=
output current
output voltage on pin 8
allowable voltage on pin 8
= 500 mV eff; measured across R
a
--------------------------- -
k
P
–
.
a
a
avg
k
+
1
;
7-4
LENAB
/V
PARAMETER
9-4
is equal to frequency response V
=
a
----------------------------- -
max
a
avg
–
a
min
M
; f
i
= 50 Hz.
7
not active;
V
active; V
I
maximum leakage
current = 10 A;
O
O(guard)
= 100 A
CONDITIONS
7-4
/V
O(guard)
= 0 V
1-2
.
4
= 3.6 V
I
7
(V
RM
) into 22 equal parts ranging
7-4
1
MIN.
/V
1-2
= voltage value across
TYP.
Product specification
TDA8356
MAX. UNIT
50
2.5
5.5
40
mA
V
V
A