Z0840004PSC Zilog, Z0840004PSC Datasheet - Page 23

• Manufacturer Part Number: Z0840004PSC
• Description: IC 4MHZ Z80 NMOS CPU 40-DIP
• Manufacturer: Zilog

Specifications of Z0840004PSC

• Processor Type: Z80
• Features: NMOS
• Speed: 4MHz
• Voltage: 5V
• Mounting Type: Through Hole
• Package / Case: 40-DIP (0.620", 15.75mm)
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ZiLOG
High Power Microscope 50x - 400x
High Power Microscope 50x - 1000x Nikon
S440 SEM
FIB With SIMS (SIMS not working)
Reactive ION Etcher (REI), 8-Inch
Polycon, BF, DF, DIC, Confocal,
Fluorescence,
W/8x8” Stage
W/Micron Stage Readout
W/Sony Color VP Video
Oscilloscopes
4145A (2)
w/LCR Meter
Visionary 2000
W/MP2000 8” Probe
Package Device Thermal
Socket Cards:
Blazer 125 Tester
W/8” Probe Station
4156B Precision Semiconductor
Parameter Analyzer
35665A Dynamic Signal Analyzer
4275A Multi-Frequency LCR Meter
ZAC03-0004
100 Lead QFP
100 Lead VQFP
124 Lead PGA
Equipment At Nampa
44 LCC/PLCC
48 Lead DIP
64 Lead Narrow Pitch DIP
20 Lead PLCC
44 Lead PLCC
68 Lead PLCC
84 Lead PLCC
44 Lead PQFP
64 Lead DIP
28 Lead DIP (300 Mil)
Table 3-1. Summary of QC Test Equipment
ZiLOG Designed
Micromanipulator
ZiLOG Designed
Nikon
Leica
FEI
Leica-Reichert
Semprex
Optronics
Sony
HP
HP
Hypervision
Carl Suss
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Temptronics
Wentworth
HP
HP
HP
Trion
HP, Tektronics 7704
Temptronics
IMS
Brand
Bench Microprobe Work
Die Visual Microscope
Die Visual Chip Unzip Inspection
High Power Imaging
Micro Cross Sectioning, Device
Modification and Elemental
Analysis and Imaging
Device Deprocessing
Feature Size Measurement
Video Camera
3x4 Inch Color Video Print
Signal and Waveform Monitor
Parametric Tester
Capacitance and CV Measure
Emission Microscope,
Device Microprobe, CV
Microprobe and Liquid
Crystal (Room and Hot)
Bitmapping, Device Test
Microprobe
Parametric Tester
Tester
Tester (Inductance, capacitance,
resistance instrument)
Product Visual Examination
Emission Microscope,
2002 Quality and Reliability Report
Usage
2 - 7