EPM7256SQC208-10N Altera, EPM7256SQC208-10N Datasheet - Page 18

IC MAX 7000 CPLD 256 208-PQFP

EPM7256SQC208-10N

Manufacturer Part Number
EPM7256SQC208-10N
Description
IC MAX 7000 CPLD 256 208-PQFP
Manufacturer
Altera
Series
MAX® 7000r
Datasheet

Specifications of EPM7256SQC208-10N

Programmable Type
In System Programmable
Delay Time Tpd(1) Max
10.0ns
Voltage Supply - Internal
4.75 V ~ 5.25 V
Number Of Logic Elements/blocks
16
Number Of Macrocells
256
Number Of Gates
5000
Number Of I /o
164
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
208-MQFP, 208-PQFP
Voltage
5V
Memory Type
EEPROM
Number Of Logic Elements/cells
16
Family Name
MAX 7000S
# Macrocells
256
Number Of Usable Gates
5000
Frequency (max)
125MHz
Propagation Delay Time
10ns
Number Of Logic Blocks/elements
16
# I/os (max)
164
Operating Supply Voltage (typ)
5V
In System Programmable
Yes
Operating Supply Voltage (min)
4.75V
Operating Supply Voltage (max)
5.25V
Operating Temp Range
0C to 70C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
208
Package Type
PQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Lead Free Status / Rohs Status
Compliant

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EPM7256SQC208-10N
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Quantity:
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MAX 7000 Programmable Logic Device Family Data Sheet
18
Programming Times
The time required to implement each of the six programming stages can
be broken into the following two elements:
By combining the pulse and shift times for each of the programming
stages, the program or verify time can be derived as a function of the TCK
frequency, the number of devices, and specific target device(s). Because
different ISP-capable devices have a different number of EEPROM cells,
both the total fixed and total variable times are unique for a single device.
Programming a Single MAX 7000S Device
The time required to program a single MAX 7000S device in-system can
be calculated from the following formula:
where: t
The ISP times for a stand-alone verification of a single MAX 7000S device
can be calculated from the following formula:
where: t
t PROG
t
VER
A pulse time to erase, program, or read the EEPROM cells.
A shifting time based on the test clock (TCK) frequency and the
number of TCK cycles to shift instructions, address, and data into the
device.
=
=
t
VPULSE
t
Cycle
f
t
Cycle
TCK
t PPULSE
PROG
PPULSE
VER
VPULSE
PTCK
VTCK
+
+
Cycle
--------------------------------
Cycle
------------------------------- -
= Programming time
= Sum of the fixed times to erase, program, and
= Number of TCK cycles to program a device
= TCK frequency
f
= Verify time
= Sum of the fixed times to verify the EEPROM cells
= Number of TCK cycles to verify a device
TCK
f
TCK
VTCK
verify the EEPROM cells
PTCK
Altera Corporation

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