AD5241BRZ100 Analog Devices Inc, AD5241BRZ100 Datasheet - Page 6

IC DGTL POT 256POS 14-SOIC

AD5241BRZ100

Manufacturer Part Number
AD5241BRZ100
Description
IC DGTL POT 256POS 14-SOIC
Manufacturer
Analog Devices Inc
Datasheet

Specifications of AD5241BRZ100

Taps
256
Resistance (ohms)
100K
Number Of Circuits
1
Temperature Coefficient
30 ppm/°C Typical
Memory Type
Volatile
Interface
I²C, 2-Wire Serial
Voltage - Supply
2.7 V ~ 5.5 V, ±2.3 V ~ 2.7 V
Operating Temperature
-40°C ~ 105°C
Mounting Type
Surface Mount
Package / Case
14-SOIC (3.9mm Width), 14-SOL
Resistance In Ohms
100K
End To End Resistance
100kohm
No. Of Steps
256
Resistance Tolerance
+50, -30%
Supply Voltage Range
2.7V To 5.5V, ± 2.3V To ± 2.7V
Control Interface
I2C, Serial
No. Of Pots
Single
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
AD5241BRZ100
Manufacturer:
ADI/亚德诺
Quantity:
20 000
AD5241/AD5242
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
V
V
I
Digital Input Voltage to GND
Operating Temperature Range
Thermal Resistance θ
Maximum Junction Temperature (T
Package Power Dissipation
Storage Temperature Range
Lead Temperature
1
A
Maximum current increases at lower resistance and different packages.
DD
SS
DD
A
A
, I
R
R
R
, V
14-Lead SOIC
16-Lead SOIC
14-Lead TSSOP
16-Lead TSSOP
Vapor Phase, 60 sec
Infrared, 15 sec
= 25°C, unless otherwise noted.
B
AB
AB
AB
to GND
to GND
to V
, I
B
, V
= 10 kΩ in TSSOP-14
= 100 kΩ in TSSOP-14
= 1 MΩ in TSSOP-14
W
W
SS
to GND
JA
J
max)
Rating
−0.3 V to +7 V
0 V to −7 V
7 V
V
5.0 mA
1.5 mA
0.5 mA
0 V to V
−40°C to +105°C
158°C/W
73°C/W
206°C/W
180°C/W
150°C
P
−65°C to +150°C
215°C
220°C
SS
D
= (T
to V
J
1
1
DD
1
DD
max − T
+ 0.3 V
A
)/θ
Rev. C | Page 6 of 20
JA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION

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