MAX1182ECM+D Maxim Integrated Products, MAX1182ECM+D Datasheet - Page 17

• Manufacturer Part Number: MAX1182ECM+D
• Description: IC ADC 10BIT 65MSPS DUAL 48-TQFP
• Manufacturer: Maxim Integrated Products

Specifications of MAX1182ECM+D

• Number Of Bits: 10
• Sampling Rate (per Second): 65M
• Data Interface: Parallel
• Number Of Converters: 2
• Power Dissipation (max): 240mW
• Voltage Supply Source: Single Supply
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 48-TQFP Exposed Pad, 48-eTQFP, 48-HTQFP, 48-VQFP
• Conversion Rate: 65 MSPs
• Resolution: 10 bit
• Snr: 59.5 dB
• Voltage Reference: 2.048 V
• Supply Voltage (max): 3.6 V
• Supply Voltage (min): 2.7 V
• Maximum Power Dissipation: 2430 mW
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• Input Voltage: 3 V
• Minimum Operating Temperature: - 40 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the MAX1182 are measured using
the best straight-line fit method.
Differential nonlinearity is the difference between an
actual step-width and the ideal value of 1 LSB. A DNL
Figure 6. Transformer-Coupled Input Drive
with Internal Reference and Parallel Outputs
Static Parameter Definitions
Differential Nonlinearity (DNL)
Dual 10-Bit, 65Msps, 3V, Low-Power ADC
______________________________________________________________________________________
Integral Nonlinearity (INL)
V
V
IN
IN
0.1μF
0.1μF
N.C.
N.C.
MINICIRCUITS
MINICIRCUITS
3
3
1
1
2
2
TT1–6
TT1–6
T1
T1
6
5
4
6
5
4
2.2μF
2.2μF
25Ω
25Ω
25Ω
25Ω
0.1μF
0.1μF
22pF
22pF
22pF
22pF
error specification of less than 1 LSB guarantees no
missing codes and a monotonic transfer function.
Figure 9 depicts the aperture jitter (t
sample-to-sample variation in the aperture delay.
Aperture delay (t
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
Dynamic Parameter Definitions
INA+
COM
INA-
INB+
INB-
MAX1182
AD
) is the time defined between the
Aperture Delay
Aperture Jitter
AJ
), which is the
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