5962-8959841MZA QP SEMICONDUCTOR, 5962-8959841MZA Datasheet - Page 19

• Manufacturer Part Number: 5962-8959841MZA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8959841MZA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
1/ When performing postirradiation electrical measurements for any RHA level T
T
the device types column.
2/ Preirradiation values for RHA marked devices shall also be the postirradiation values unless otherwise specified.
3/ This parameter is tested initially and after any design or process change which could affect this parameter, and therefore
shall be guaranteed to the limits specified in table I.
4/ Functional tests shall include the test table and other test patterns used for fault detection as approved by the qualifying
5/ For timing waveforms see figure 4 and for output load circuits, see figure 5.
6/ AC measurements assume transition time ≤ 5 ns, input levels are from ground to 3.0 V, and output load C L ≥ 30 pF except
7/ Transition is measured ±500 mV from steady state voltage.
Retention time
Operation recovery time
A
= +25°C ± 5°C. The M, D, and P in the test condition column are the postirradiation limits for the device types specified in
activity. Outputs are measured at V OL < 1.5 V, V OH > 1.5 V.
as noted on figure 5. Timing reference levels are 1.5 V.
Test
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
3/
3/
STANDARD
Symbol
t CDR
t R
TABLE I. Electrical performance characteristics - Continued.
V SS = 0 V; 4.5 V ≤ V CC ≤ 5.5 V
See figure 4, as applicable
unless otherwise specified
-55°C ≤ T C ≤ +125°C
Conditions
M,D,P
M,D,P
SIZE
A
subgroups
9, 10, 11
9, 10, 11
Group A
9 1/
9 1/
A
= +25°C. Limits shown are guaranteed at
REVISION LEVEL
Device
01,05,
13,22,
30
02,06,
14,23,
31
41,44,
48
types
03,07,
15,24,
32
04,08,
16,25,
33,42,
43
09,17,
26,34
10,18,
27,35
11,19,
28,36
47
12,20,
29,37
21,
38- 40
45,46
All
All
R
Min
120
100
0
2/
2/
85
70
55
45
35
30
25
20
15
12
Limits
SHEET
5962-89598
Max
Unit
ns
ns
19