LCP3121SRL STMicroelectronics, LCP3121SRL Datasheet - Page 4

• Manufacturer Part Number: LCP3121SRL
• Manufacturer: STMicroelectronics

Specifications of LCP3121SRL

• Lead Free Status / RoHS Status: Compliant

LCP3121
Fig.
peak-on-state current versus overload duration.
4/6
FUNCTIONAL HOLDING CURRENT (I
20
18
16
14
12
10
8
6
4
2
0
0.01
I
TSM
This is a GO-NO GO test which allows to confirm the holding current (I
TEST PROCEDURE :
- Adjust the current level at the I
- Fire the D.U.T. with a surge current : I
- The D.U.T. will come back to the off-state within a duration of 50ms max.
(A)
1:
0.10
V
Maximum
BAT
= -48 V
1
t(s)
non
10
repetitive
H
R
value by short circuiting the D.U.T.
F=50Hz
Tj initial = 25°c
100
H
) TEST CIRCUIT : GO-NO GO TEST
PP
surge
= 10A, 10/1000 s.
1000
D.U.T
Fig. 2: Relative variation of holding current versus
junction temperature (typical values).
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-40
IH [Tj] / IH [Tj=25°C]
-20
0
H
) level in a functional test circuit.
20
Tj(°C)
40
generator
60
Surge
80
-V
-V
100
P
P
120