5962-88543012A National Semiconductor, 5962-88543012A Datasheet - Page 6

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5962-88543012A

Manufacturer Part Number
5962-88543012A
Description
Manufacturer
National Semiconductor
Datasheet

Specifications of 5962-88543012A

Lead Free Status / RoHS Status
Not Compliant
DSCC FORM 2234
APR 97
1/ Not more than one output should be shorted at one time and the duration of the short circuit condition should not exceed 1
2/ TTL driven input (V
3/ This parameter is not directly testable but is derived for use in total power supply calculations.
5/ I
6/ Minimum limits shall be guaranteed, if not tested, to the limits specified in table I.
4/ For I
Propagation delay time,
Propagation delay time,
An, Bn to O (A = B)
I (A = B) to O (A = B)
second.
into account,as its effect is not intended to be included in the test results. The impact must be characterized and
appropriate offsetfactors must be applied to the test result."
CC
D
N
f
N
I
H
T
= Input frequency in MHz.
I
= I
= Number of inputs at f
CC
= Number of TTL inputs at D
= Duty cycle for TTL inputs high.
CCQ
DEFENSE SUPPLY CENTER COLUMBUS
tests, in an ATE environment, the effect of parasitic output capacitive loading from the test environment must be taken
+ (I
Test
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
CC
x D
IN
H
STANDARD
= 3.4 V); all other inputs at V
x N
T
) + (I
I
.
Symbol
t
t
t
t
PLH1
PLH2
PHL1
PHL2
6/
6/
CCD
TABLE I. Electrical performance characteristics - Continued
H.
,
,
x f
I
x N
C
R
See figure 4
C
R
See figure 4
L
L
L
L
= 50 pF
= 500Ω
= 50 pF
= 500Ω
I
unless otherwise specified
), where:
-55C  T
V
CC
= 5.0 V dc ±10%
CC
Conditions
or GND.
C
+125C
SIZE
A
Device
type
01
02
03
01
02
03
REVISION LEVEL
5.0 V
5.0 V
V
CC
subgroups
9, 10, 11
9, 10, 11
Group A
D
1.5
1.5
1.5
1.5
1.5
1.5
Min
Limits
SHEET
5962-88543
Max
9.5
7.3
9.0
7.8
6.0
15
6
Unit
ns
ns

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