54ACT520DMQB. National Semiconductor, 54ACT520DMQB. Datasheet

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54ACT520DMQB.

Manufacturer Part Number
54ACT520DMQB.
Description
Manufacturer
National Semiconductor
Datasheet

Specifications of 54ACT520DMQB.

Lead Free Status / RoHS Status
Not Compliant
PMIC N/A
DSCC FORM 2233
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
THIS DRAWING IS AVAILABLE
DEPARTMENT OF DEFENSE
APR 97
AND AGENCIES OF THE
LTR
MICROCIRCUIT
C
A
B
FOR USE BY ALL
STANDARD
DEPARTMENTS
DRAWING
AMSC N/A
Add device types 03 and 04. Add vendor CAGE 01295. Technical and
editorial changes throughout.
Correct title to accurately describe devices. Update boilerplate to
MIL-PRF-38535 requirements. Editorial changes throughout. – LTG
Correct footnote 3 in table I. - LTG
PREPARED BY
CHECKED BY
DRAWING APPROVAL DATE
REVISION LEVEL
REV
SHEET
APPROVED BY
Marcia B. Kelleher
Thomas J. Riccuiti
Michael A. Frye
DESCRIPTION
90-01-17
C
C
1
B
2
REVISIONS
B
3
MICROCIRCUIT, DIGITAL, ADVANCED CMOS,
8-BIT IDENTITY COMPARATOR, TTL
COMPATIBLE INPUTS, MONOLITHIC SILICON
SHEET
B
4
SIZE
A
B
5
DEFENSE SUPPLY CENTER COLUMBUS
C
6
COLUMBUS, OHIO 43218-3990
CAGE CODE
67268
http://www.dscc.dla.mil
B
7
DATE (YR-MO-DA)
1 OF
91-02-26
06-08-09
06-12-20
B
8
12
B
9
10
B
5962-89793
M. A. Frye
Thomas M. Hess
Thomas M. Hess
11
B
5962-E133-07
APPROVED
12
B

Related parts for 54ACT520DMQB.

54ACT520DMQB. Summary of contents

Page 1

LTR A Add device types 03 and 04. Add vendor CAGE 01295. Technical and editorial changes throughout. B Correct title to accurately describe devices. Update boilerplate to MIL-PRF-38535 requirements. Editorial changes throughout. – LTG C Correct footnote 3 in table ...

Page 2

SCOPE 1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A. 1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example: 5962-89793 ...

Page 3

Recommended operating conditions. Supply voltage range (V ) ........................................................................................ +4 +5 Input voltage range (V ) ............................................................................................ +0 Output voltage range (V )....................................................................................... +0 ...

Page 4

Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full case operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups ...

Page 5

Test Symbol High level output V OH voltage 1/ Low level output V OL voltage 1/ High level input V IH voltage 2/ Low level input V IL voltage 2/ Input leakage current, I IL1 B inputs, low Input leakage ...

Page 6

TABLE I. Electrical performance characteristics - Continued. Test Symbol Input capacitance C IN Power dissipation C PD capacitance 3/ Functional tests Propagation delay t PHL1 time A=B t PLH1 Propagation delay t PHL2 time, ...

Page 7

Device types Case outlines Terminal number – Word A inputs B0 – Word B inputs ...

Page 8

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device types 01 and 03 FIGURE 3. Logic diagram. SIZE A REVISION LEVEL 5962-89793 SHEET B 8 ...

Page 9

STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43218-3990 DSCC FORM 2234 APR 97 Device types 02 and 04 FIGURE 3. Logic diagram – Continued. SIZE A 5962-89793 REVISION LEVEL SHEET B 9 ...

Page 10

NOTES minimum or equivalent (includes test jig and probe capacitance 500Ω or equivalent 50Ω or equivalent 3.0 ns (10 percent to 90 ...

Page 11

VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality ...

Page 12

MIL-STD-883 test requirements Interim electrical parameters (method 5004) Final electrical test parameters (method 5004) Group A test requirements (method 5005) Groups C and D end-point electrical parameters (method 5005) * PDA applies to subgroup 1. 5. PACKAGING 5.1 Packaging requirements. ...

Page 13

STANDARD MICROCIRCUIT DRAWING BULLETIN Approved sources of supply for SMD 5962-89793 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the ...

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