SAA7111AH NXP Semiconductors, SAA7111AH Datasheet - Page 19

• Manufacturer Part Number: SAA7111AH
• Manufacturer: NXP Semiconductors

Specifications of SAA7111AH

• Pin Count: 64
• Package Type: PQFP
• Lead Free Status / RoHS Status: Compliant

Philips Semiconductors
9
The SAA7111A has built in logic and 5 dedicated pins to
support boundary-scan testing which allows board testing
without special hardware (nails). The SAA7111A follows
the ‘IEEE Std. 1149.1 - Standard Test Access Port and
Boundary-Scan Architecture ’ set by the Joint Test Action
Group (JTAG) chaired by Philips.
The 5 special pins are Test Mode Select (TMS), Test
Clock (TCK), Test Reset (TRST), Test Data Input (TDI)
and Test Data Output (TDO).
The BST functions BYPASS, EXTEST, INTEST,
SAMPLE, CLAMP and IDCODE are all supported
(see Table 1). Details about the JTAG BST-TEST can be
found in the specification “ EEE Std. 1149.1” . A file
containing the detailed Boundary-Scan Description
Language (BSDL) description of the SAA7111A is
available on request.
9.1
The Test Access Port (TAP) controller of an IC should be
in the reset state (TEST_LOGIC_RESET) when the IC is
in functional mode. This reset state also forces the
instruction register into a functional instruction such as
IDCODE or BYPASS.
To solve the power-up reset, the standard specifies that
the TAP controller will be forced asynchronously to the
TEST_LOGIC_RESET state by setting the TRST pin
LOW.
Table 1
1998 May 15
INSTRUCTION
Enhanced Video Input Processor (EVIP)
BOUNDARY-SCAN TEST
SAMPLE
BYPASS
EXTEST
IDCODE
INTEST
CLAMP
USER1
Initialization of boundary-scan circuit
BST instructions supported by the SAA7111A
This mandatory instruction provides a minimum length serial path (1 bit) between TDI and TDO
when no test operation of the component is required.
This mandatory instruction allows testing of off-chip circuitry and board level interconnections.
This mandatory instruction can be used to take a sample of the inputs during normal operation of
the component. It can also be used to preload data values into the latched outputs of the
boundary-scan register.
This optional instruction is useful for testing when not all ICs have BST. This instruction addresses
the bypass register while the boundary-scan register is in external test mode.
This optional instruction will provide information on the components manufacturer, part number and
version number.
This optional instruction allows testing of the internal logic (no support for customers available).
This private instruction allows testing by the manufacturer (no support for customers available).
19
DESCRIPTION
9.2
A Device Identification Register (DIR) is specified in ‘IEEE
Std. 1149.1-1990 - IEEE Standard Test Access Port and
Boundary-Scan Architecture ’ (IEEE Std. 1149.1b-1994).
It is a 32-bit register which contains fields for the
specification of the IC manufacturer, the IC part number
and the IC version number. Its biggest advantage is the
possibility to check for the correct ICs mounted after
production and determination of the version number of
ICs during field service.
When the IDCODE instruction is loaded into the BST
instruction register, the identification register will be
connected between TDI and TDO of the IC.
The identification register will load a component specific
code during the CAPTURE_DATA_REGISTER state of
the TAP controller and this code can subsequently be
shifted out. At board level this code can be used to verify
component manufacturer, type and version number.
The device identification register contains 32-bits,
numbered 31 to 0, where bit 31 is the Most Significant Bit
(MSB) (nearest to TDI) and bit 0 is the Least Significant
Bit (LSB) (nearest to TDO); see Fig.11.
Device identification codes
Product specification
SAA7111A