5962-9080303MLA QP SEMICONDUCTOR, 5962-9080303MLA Datasheet - Page 13

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5962-9080303MLA

Manufacturer Part Number
5962-9080303MLA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

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DSCC FORM 2234
APR 97
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
Line
No.
10
1
2
3
4
5
6
7
8
9
1/ Blank spaces indicate tests are not applicable.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ * indicates PDA applies to subgroup 1 and 7.
4/ ** see 4.4.1d.
5/ ∆ indicates delta limit (see table IIB) shall be required where specified, and the delta
Interim electrical
Static burn-in I
Same as line 1
Dynamic burn-in
Same as line 1
Final electrical
Group A test
Group C end-point
Group D end-point
Group E end-point
STANDARD
values shall be computed with reference to the previous interim electrical parameters (line 1).
parameters (see 4.2)
method 1015
(method 1015)
parameters
requirements
electrical parameters
electrical parameters
electrical parameters
requirements
Test
TABLE IIA. Electrical test requirements.
1/ The above parameter shall be recorded
I
CC2
Test 1/
before and after the required burn-in and
life tests to determine the delta.
1*, 2, 3, 7*, 8A, 8B, 9, 10,
11
1, 2, 3, 4**, 7, 8A, 8B, 9,
10, 11
2, 3, 7, 8A, 8B
2, 3, 7, 8A, 8B
1, 7, 9
TABLE IIB. Delta limits at +25°C.
standby
I
I
OZ
IX
method 5005, table I)
(in accordance with
Device class M
MIL-STD-883,
Not required
Subgroups
Required
±10 percent of specified
±10 percent of specified
±10 percent of specified
value in table I
value in table I
value in table I
Device types
SIZE
All
A
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11
1, 2, 3, 4**, 7,
8A, 8B, 9, 10, 11
2, 3, 7, 8A, 8B
2, 3, 7, 8A, 8B
1, 7, 9
1/, 2/, 3/, 4/, 5/
Device class Q
Not required
Required
REVISION LEVEL
(per MIL-PRF-38535,
Subgroups
table III)
C
(1, 7, 9) or
(2, 8A, 10)
1*, 7* ∆
1*, 7* ∆
1*, 2, 3, 7*, 8A,
8B, 9, 10, 11
1, 2, 3, 4**, 7, 8A,
8B, 9, 10, 11
9, 10, 11 ∆
1, 7, 9
1, 2, 3, 7, 8A, 8B,
2, 3, 7, 8A, 8B
Device class V
Required
Required
SHEET
5962-90803
13

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