CR1206-J/-000ELF Bourns Inc., CR1206-J/-000ELF Datasheet - Page 2

• Manufacturer Part Number: CR1206-J/-000ELF
• Description: RESISTOR, CHIP, JUMPER, ZERO OHM, 250mW
• Manufacturer: Bourns Inc.

Specifications of CR1206-J/-000ELF

• Resistance Tolerance: ± 5%
• Power Rating: 250mW
• Voltage Rating: 200V
• Resistor Element Material: Thick Film
• Resistor Case Style: 1206
• No. Of Pins: 2
• Peak Reflow Compatible (260 C): Yes
• Resistance: 0 Ohms
• Tolerance: 5 %
• Temperature Coefficient: - 250 PPM / C to + 500 PPM / C
• Termination Style: SMD/SMT
• Package / Case: 1206 (3216 metric)
• Operating Temperature Range: - 55 C to + 155 C
• Dimensions: 1.6 mm W x 3.2 mm L x 0.6 mm H
• Product: Thick Film Resistors Zero-Ohm
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Specifications are subject to change without notice.
Customers should verify actual device performance in their specific applications.
Performance Characteristics (Tests According to MIL-STD-202, MIL-R-55342B, EIA RS-396)
DC Resistance
Thermal Shock
Low Temperature
Operation
Short Time
Overload
High Temperature
Exposure
Resistance to
Soldering Heat
Moisture
Resistance
Load Life
1000 Hours
Solderability
Terminal Strength
Current Noise
Humidity,
Steady State
Salt Spray
Vibration
Voltage Coefficient
Insulation
Resistance
Dielectric
Withstanding
Voltage
Drop Test
Bending Test
CR0603/CR0805/CR1206 - Chip Resistors
Test
—
-40 °C, 60 minutes;
+125 °C, 60 minutes
-55 °C, 1 hour off;
45 minutes on
Rated Voltage x 2.5;
5 seconds
CR0603: 100 V max.
CR0805; 300 V max.
CR1206: 400 V max.
+125 °C; 1000 hours
260 °C, 10 seconds
90-98 %RH; 10 cycles
+70 °C; 1.5 hours on,
0.5 hours off;
1000 hours
+235 °C; 3 seconds
Pull Test
Quan-Tech Model 315B MIL-STD-202 308
+40 °C; 90-95 % RH,
1344 Hours
96 hours
10-2000 Hz, 6 hours
—
Test Potential 500V
CR0603: 100V
—
1 m
5 mm/90 mm; 10 sec.
Procedure
MIL-STD-202 303
EIA RS-396 4.4
MIL-STD-202 107
EIA RS-396 4.5
MIL-R-55342D 4.7.4
EIA RS-396 4.6
MIL-R-55342D 4.7.5
EIA RS-396 4.7
MIL-R-55342D 4.7.6
EIA RS-396 4.8
MIL-R-55342D 4.7.7
MIL-STD-202 106D
EIA RS-396 4.9
MIL-STD-202 108
Condition D
EIA RS-396 4.12
MIL-STD-202 208
EIA RS-396 4.11
MIL-R-55342D 4.7.12
MIL-STD-202 103B
Condition D
MIL-STD-202 101D
Condition A
MIL-STD-202 201A
MIL-STD-202 309
MIL-STD-202 302
Condition B
MIL-STD-202 301
MIL-STD-202 203B
—
Method
MIL-R-55342D 4.7.2
MIL-R-55342D 4.7.3
MIL-R-55342D 4.7.4
MIL-R-55342D 4.7.5
MIL-R-55342D 4.7.6
MIL-R-55342D 4.7.7
MIL-R-55342D 4.7.8
MIL-R-55342D 4.7.10
MIL-R-55342D 4.7.11
MIL-R-55342D 4.7.12
MIL-R-55342D 6.6
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Specification
F:≤±1 %
≤±0.5 % +0.05 Ω
≤±0.5 % 0.05 Ω
≤±1 % +0.05 Ω
≤±1.0 % +0.05 Ω
≤±0.5 % +0.05 Ω
≤±0.5 % +0.05 Ω
≤±1.0 % +0.05 Ω
≥95 % of area
covered
≥500 g
R≤1k Ω; max. 1 µV/V
R≤10k Ω; max. 3 µV/V
R≤100k Ω; max. 6 µV/V
R≤1M Ω; max. 10 µV/V
≤±2.5 % +0.05 Ω
≤±1.0 % +0.2 Ω
≤±0.5 % +0.1 Ω
≤100 ppm/V
≥10
≤±0.5 % +0.1 Ω
≤±1 % +0.05 Ω
3
M Ω
1 %
≥500 V (CR1206, CR0805)
≥300 V (CR0603)
Deviation from Nominal
≤±5.0 %
≤±1 % +0.05 Ω
≤±1.0 % +0.05 Ω
≤±2.0 % +0.05 Ω
≤+2.0 % +0.1 Ω
≤±1.0 % +0.05 Ω
≤±2.0 % +0.05 Ω
≤±3.0 % +0.1 Ω
≥95 % of area
covered
≥500 g
R≤1k Ω; max. 1 µV/V
R≤10k Ω; max. 3 µV/V
R≤100k Ω; max. 6 µV/V
R≤2M Ω; max. 10 µV/V
≤±2.5 % +0.05 Ω
≤±1.0 % +0.1 Ω
≤±1.0 % +0.1 Ω
≤100 ppm/V
≥10
≤±1.0 % +0.1 Ω
≤±1.0 % +0.05 Ω
3
M Ω
5 %