ACMD-7409-BLK Avago Technologies US Inc., ACMD-7409-BLK Datasheet - Page 3

• Manufacturer Part Number: ACMD-7409-BLK
• Description: Duplexer, FBAR, US PCS
• Manufacturer: Avago Technologies US Inc.
• Series: -r

Specifications of ACMD-7409-BLK

• Frequency Bands (low / High): 1.85GHz ~ 1.9GHz / 1.93GHz ~ 1.99GHz
• Low Band Attenuation (min / Max Db): 52.00dB / -
• High Band Attenuation (min / Max Db): 43.00dB / -
• Return Loss (low Band / High Band): 20dB / 17dB
• Mounting Type: Surface Mount
• Package / Case: 3-CSP
• Lead Free Status / Rohs Status: Contains lead / RoHS non-compliant

Absolute Maximum Ratings
Maximum Recommended Operating Conditions
Notes:
1. Operation in excess of any one of these conditions may result in
2. The device will function over the recommended range without
3. TC is defined as case temperature, the temperature of the underside
Characterization
A test circuit similar to that shown in Figure 1 was used
to measure typical device performance. This circuit is
designed to interface with Air Coplanar (ACP), Ground-
Signal-Ground (GSG) RF probes of the type commonly
used to test semiconductor wafers.
The test circuit is a 7 x 7 mm PCB with a well-grounded pad
to which the device under test (DUT) is solder-mounted.
Short lengths of 50-ohm microstripline connect the DUT
to the ACP probe patterns on the board.
Figure 1. ACP probe test circuit
3
Parameter
Storage Temperature
Maximum RF Input Power
to Tx Ports
Parameter
Operating Temperature, Tc
Tx Power 29 dBm
Operating temperature, Tc
Tx Power 30 dBm
permanent damage to the device.
degradation in reliability or permanent change in performance, but
is not guaranteed to meet electrical specifications.
of the Duplexer where it makes contact with the circuit board.
[3]
[3]
[1]
,
,
Unit
°C
dBm
Unit
°C
°C
[2]
Value
–65 to +125
+33
Value
–40 to +100
–40 to +85
A test circuit with a ACMD-7409 mounted in place is
shown in Figure 2. S-parameters are then measured using
a network analyzer and calibrated ACP probe set.
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the
edge of the Duplexer
Figure 2. Test circuit with ACMD-7409 duplexer