SI4311-B10-GM Silicon Laboratories Inc, SI4311-B10-GM Datasheet - Page 19

• Manufacturer Part Number: SI4311-B10-GM
• Description: IC RX FSK 315/434MHZ 20VQFN
• Manufacturer: Silicon Laboratories Inc
• Series: EZRadio®r
• Type: ISM Receiverr

Specifications of SI4311-B10-GM

• Package / Case: 20-VQFN
• Frequency: 315MHz, 434MHz
• Sensitivity: -104dBm
• Data Rate - Maximum: 10 kBaud
• Modulation Or Protocol: FSK
• Applications: Garage Openers, RKE, Security Alarms
• Data Interface: PCB, Surface Mount
• Antenna Connector: PCB, Surface Mount
• Voltage - Supply: 2.7 V ~ 3.6 V
• Operating Temperature: -40°C ~ 85°C
• Operating Frequency: 315 MHz to 434 MHz
• Operating Supply Voltage: 2.7 V to 3.6 V
• Maximum Operating Temperature: + 95 C
• Minimum Operating Temperature: - 45 C
• Mounting Style: SMD/SMT
• Supply Current: 20 mA
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Features: -
• Memory Size: -
• Current - Receiving: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 336-1976-5

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Revision 0.1 to Revision 0.2
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Revision 0.2 to Revision 0.3
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OCUMENT
Maximum data rate changed from 10 to 4 kbps for
FSK and from 5 to 2 kbps for OOK with Manchester
encoding.
Maximum RF input power changed from 5 to 10
dBm.
Changed test conditions for sensitivity
measurements and added the xtal frequency
tolerance of 20 ppm.
Updated text in section “3. Functional Description”.
Added Ideal IF Bandwidth equation and description
for choosing the IF bandwidth in Section “3.4. Bit
Time BT[1:0] Selection”.
Updated Table 11, “Typical Sensitivity @ 433 MHz,
2-FSK,” on page 11.
Changed hysteresis level from 1 dB to 6 dB in
Section “3.8. Crystal Oscillator”.
Added text in section “3.8. Crystal Oscillator”
regarding the crystal frequency tolerance and IF
Bandwidth choice and sensitivity performance.
Updated features list
Reduced font size in the test condition section of
Table 5 "Si4311 Receiver Characteristics"
Added crystal tolerance equation to Table 6 "Crystal
Characteristics"
Updated matching circuit and BOM to section “2.
Test Circuit” and section “2. Typical Application
Schematic”
Modified text in Section “3. Functional Description”
Changed bandwidth option in Table 11 "Bandwidth
Selection Table Using BW[3:1] Pins" and test mode.
Reset section updated to reflect active blocks are
powered off in reset mode.
C
HANGE
L
IST
Rev. 0.6
Revision 0.3 to Revision 0.4
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Revision 0.4 to Revision 0.5
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Revision 0.5 to Revision 0.6
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Removed crystal frequency tolerance range from
Table 6 "Crystal Characteristics".
Corrected data rates in Section “3.1. Overview”.
Updated text in section “3.4. Bit Time BT[1:0]
Selection” to show FSK receive IF bandwidth
equations.
Deleted voltage gain text in section “3.7. Low Noise
Amplifier Input Circuit”.
Removed squelch circuit description in section “3.8.
Crystal Oscillator”.
Included load capacitance requirement for crystal if
no external capacitors are used in section “3.8.
Crystal Oscillator”.
Added reset to active time in section “3.9. Reset
Pin”.
Changed ordering guide part number in section “5.
Ordering Guide”.
Added FSK Automatic Frequency Calibration
information
Removed OOK feature.
Removed I
from Table 3 "DC Characteristics"
Updated sensitivity specs and test conditions in
Table 5 "Si4311 Receiver Characteristics"
Added AFC hold time description to section “3.6.
Automatic Frequency Centering (AFC)”
Added reference clock drive capability to section
“3.8. Crystal Oscillator”
Updated part number to Si4311-B11-GM
VDD
current spec when input = –30 dBm
Si4311
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