AD8343ARU-REEL Analog Devices Inc, AD8343ARU-REEL Datasheet - Page 25

• Manufacturer Part Number: AD8343ARU-REEL
• Description: IC MIXER ACTIVE HI-IP3 14-TSSOP
• Manufacturer: Analog Devices Inc
• Series: AD8343r

Specifications of AD8343ARU-REEL

• Rohs Status: RoHS non-compliant
• Rf Type: Cellular, WLAN
• Frequency: 0Hz ~ 2.5GHz
• Number Of Mixers: 1
• Gain: 7dB
• Noise Figure: 14dB
• Secondary Attributes: Up/Down Converter
• Current - Supply: 60mA
• Voltage - Supply: 4.5 V ~ 5.5 V
• Package / Case: 14-TSSOP (0.173", 4.40mm Width)
• Operating Temperature (min): -40C
• Operating Temperature (max): 85C
• Operating Temperature Classification: Industrial
• Lead Free Status / Rohs Status: Not Compliant

If the result is not as expected, the balun is probably producing
an unexpected impedance transformation. If the performance
is extremely far from the desired result and it was assumed that
the output impedance of the balun was 50 Ω, it is necessary to
measure the output impedance of the balun in question. The
design process must be repeated using the baluns output imped-
ance instead of 50 Ω as the target. However, if the performance
is close to the desired result it is possible to tweak the values of
the matching network to achieve a satisfactory outcome.
These changes begin with a change from one standard value to
the adjacent standard value. With these minor modifications to
the matching network, one is able to evaluate the trend required
to reach the desired result.
If the result is unsatisfactory and an acceptable compromise
cannot be reached by further adjustment of the matching net-
work, there are two options: obtain a better balun, or attempt a
simultaneous conjugate match to both ports of the balun.
Rev. B | Page 25 of 32
Accomplishing the latter (or even evaluating the prospects for
useful improvement) requires obtaining full two-port, single-
ended-to-differential S parameters for the balun, and requires
the use of the ATN 4000 or a similar multiport network
analyzer test set. Gonzalez presents formulas for calculating
the simultaneous conjugate match in his book, Microwave
Transistor Amplifiers.
At higher frequencies, the measurement process described above
becomes increasingly corrupted by unaccounted for impedance
transformations occurring in the traces and pads between the
input connectors and the extended reference plane. One approach
to dealing with this problem is to access the desired measure-
ment points by soldering down semirigid coaxial cables that
have been connected to the VNA and directly calibrated at the
free ends.
AD8343