OM11014 NXP Semiconductors, OM11014 Datasheet - Page 57

BOARD EVAL FOR LPC2919

OM11014

Manufacturer Part Number
OM11014
Description
BOARD EVAL FOR LPC2919
Manufacturer
NXP Semiconductors
Series
Keilr
Type
MCUr
Datasheet

Specifications of OM11014

Contents
Board, Cable, CD
For Use With/related Products
LPC2919
Lead Free Status / RoHS Status
Not applicable / Not applicable
Other names
568-4360
NXP Semiconductors
Table 31.
V
respect to ground; positive currents flow into the IC; unless otherwise specified.
[1]
[2]
[3]
[4]
[5]
LPC2917_19_1
Product data sheet
Symbol
External static memory controller
t
t
UART
f
SPI
f
Jitter specification
t
a(R)int
a(W)int
UART
SPI
jit(cc)(p-p)
DD(CORE)
All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at T
temperature on wafer level. Cased products are tested at T
test conditions to cover the specified temperature and power supply voltage range.
See
This parameter is not part of production testing or final testing, hence only a typical value is stated.
Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully
stable.
Duty cycle clock should be as close as possible to 50 %.
Table
= V
Dynamic characteristics
23.
DD(OSC_PLL)
Parameter
internal read access
time
internal write access
time
UART frequency
SPI operating
frequency
cycle to cycle jitter
(peak-to-peak value)
; V
DD(IO)
= 2.7 V to 3.6 V; V
…continued
Conditions
master operation
slave operation
on CAN TXDC pin
Rev. 01 — 31 July 2008
DDA(ADC3V3)
amb
= 25 C (final testing). Both pre-testing and final testing use correlated
= 3.0 V to 3.6 V; T
[3]
ARM9 microcontroller with CAN and LIN
Min
-
-
1
1
1
-
65024
65024
65024
[1]
vj
f
f
f
clk(uart)
clk(spi)
clk(spi)
= 40 C; all voltages are measured with
Typ
-
-
-
-
-
0.4
LPC2917/19
Max
20.5
24.9
1
1
1
1
2
2
4
f
f
f
© NXP B.V. 2008. All rights reserved.
clk(uart)
clk(spi)
clk(spi)
amb
= 125 C ambient
Unit
ns
ns
MHz
MHz
MHz
ns
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