LH28F160S5T-L70A Sharp Microelectronics, LH28F160S5T-L70A Datasheet - Page 36

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LH28F160S5T-L70A

Manufacturer Part Number
LH28F160S5T-L70A
Description
IC FLASH 16MBIT 70NS 56TSOP
Manufacturer
Sharp Microelectronics
Datasheet

Specifications of LH28F160S5T-L70A

Rohs Status
RoHS non-compliant
Format - Memory
FLASH
Memory Type
FLASH
Memory Size
16M (2M x 8 or 1M x 16)
Speed
70ns
Interface
Parallel
Voltage - Supply
4.75 V ~ 5.25 V
Operating Temperature
0°C ~ 70°C
Package / Case
56-TSOP
Other names
425-1840
LHF16KA9

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sharp
6.2.2 AC INPUT/OUTPUT TEST CONDITIONS
Figure 16. Transient Equivalent Testing
DEVICE
UNDER
TEST
Input rise and fall times (10% to 90%) <10 ns.
(2.0 V
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
AC test inputs are driven at V
0.45
3.0
0.0
2.4
C
TTL
L
Capacitance
Includes Jig
Figure 14. Transient Input/Output Reference Waveform for V
) and V
Figure 15. Transient Input/Output Reference Waveform for V
Load Circuit
IL
INPUT
INPUT
(0.8 V
1.3V
TTL
R
). Output timing ends at V
C
L
1N914
=3.3kΩ
OH
L
(2.4 V
1.5
(High Speed Testing Configuration)
(Standard Testing Configuration)
0.8
2.0
TTL
OUT
) for a Logic "1" and V
LHF16KA9
IH
and V
TEST POINTS
TEST POINTS
IL
. Input rise and fall times (10% to 90%) <10 ns.
OL
(0.45 V
Test Configuration Capacitance Loading Value
V
V
CC
CC
TTL
Test Configuration
=5V±0.25V
=5V±0.5V
) for a Logic "0." Input timing begins at V
CC
CC
=5V±0.25V
=5V±0.5V
1.5
2.0
0.8
OUTPUT
OUTPUT
C
L
100
30
IH
(pF)
Rev. 2.0
33

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