AM28F010A-150EI AMD [Advanced Micro Devices], AM28F010A-150EI Datasheet - Page 24

• Manufacturer Part Number: AM28F010A-150EI
• Description: 1 Megabit (128 K x 8-Bit) CMOS 12.0 Volt, Bulk Erase Flash Memory with Embedded Algorithms
• Manufacturer: AMD [Advanced Micro Devices]

SWITCHING TEST WAVEFORMS
SWITCHING CHARACTERISTICS over operating range, unless otherwise specified
AC Characteristics—Read-Only Operations
Notes:
1. Guaranteed by design; not tested.
2. Not 100% tested.
24
AC Testing (all speed options except -70): Inputs are driven at
2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise
and fall times are 10 ns.
JEDEC
t
t
t
t
t
t
t
t
t
t
2.4 V
0.45 V
AVAV
ELQV
AVQV
GLQV
ELQX
EHQZ
GLQX
GHQZ
AXQX
VCS
Parameter
Symbols
Standard Parameter Description
t
t
t
t
t
t
t
t
t
RC
CE
ACC
OE
LZ
DF
OLZ
DF
OH
Input
Read Cycle Time (Note 3)
Chip Enable Access Time
Address Access Time
Output Enable Access Time
Chip Enable to Output in Low Z (Note 3)
Chip Disable to Output in High Z (Note 1)
Output Enable to Output in Low Z (Note 3)
Output Disable to Output in High Z (Note 3)
Output Hold Time From First Address, CE
or OE
V
2.0 V
0.8 V
CC
Set-up Time to Valid Read (Note 3)
#
Test Points
change (Note 3)
2.0 V
0.8 V
Output
Am28F010A
#
,
AC Testing for -70 devices: Inputs are driven at 3.0 V for a
logic “1” and 0 V for a logic “0”. Input pulse rise and fall times
are 10 ns.
3 V
0 V
Max
Max
Max
Max
Max
Min
Min
Min
Min
Min
1.5 V
-70
70
70
70
35
20
20
50
0
0
0
Input
Am28F010A Speed Options
-90
90
90
90
35
20
20
50
0
0
0
-120
120
120
120
Test Points
50
30
30
50
0
0
0
-150
150
150
150
55
35
35
50
0
0
0
Output
-200
200
200
200
55
35
35
50
0
0
0
16778D-17
1.5 V
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns