ne56632-xx NXP Semiconductors, ne56632-xx Datasheet - Page 7
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ne56632-xx
Manufacturer Part Number
ne56632-xx
Description
Active-low System Reset With Adjustable Delay Time
Manufacturer
NXP Semiconductors
Datasheet
1.NE56632-XX.pdf
(15 pages)
Philips Semiconductors
TYPICAL PERFORMANCE CURVES, NE56632-31
2003 Oct 14
Active-LOW system reset with adjustable delay time
Figure 14. LOW–level output voltage versus temperature.
Figure 16. Supply current (OFF time) versus temperature.
3.10
3.09
3.08
3.11
Figure 12. Detection threshold versus temperature.
0.23
0.22
0.21
0.20
0.19
0.18
0.17
4.5
4.0
3.5
3.0
2.5
2.0
–40
–40
–40
Test Circuit 1
R
V
L
CC1
=
= V
–20
–20
–20
S(typ)
/0.85
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
0
0
0
20
20
20
40
40
40
amb
Test Circuit 1
V
R
S1 = ON
amb
amb
CC1
L
Test Circuit 1
V
R
V
S1 = ON
= 4.7 k
60
60
60
( C)
( C)
( C)
CC
OL
L
= V
= 4.7 k
= HIGH-to-LOW
0.4 V
S(min)
80
80
80
– 0.05 V
SL01629
SL01631
SL01633
100
100
100
7
Figure 15. Supply current (ON time) versus temperature.
Figure 17. Min. operating threshold voltage versus
Figure 13. Hysteresis voltage versus temperature.
0.9
0.8
0.7
0.6
0.5
0.4
0.3
90
80
70
60
50
40
30
9
8
7
6
5
4
3
2
–40
–40
–40
Test Circuit 1
V
R
S1 = ON
Test Circuit 1
V
R
Test Circuit 1
R
V
S1 = ON
CC
CC1
OL
L
L
L
= 4.7 k
=
= 4.7 k
= LOW-to-HIGH
= V
0.4 V
–20
–20
–20
S(min)
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
AMBIENT TEMPERATURE, T
– 0.05 V
0
0
0
temperature.
20
20
20
40
40
40
NE56632-XX
amb
amb
amb
60
60
60
( C)
( C)
( C)
Product data
80
80
80
SL01630
SL01632
SL01634
100
100
100