ATmega3290A Atmel Corporation, ATmega3290A Datasheet - Page 255
ATmega3290A
Manufacturer Part Number
ATmega3290A
Description
Manufacturer
Atmel Corporation
Specifications of ATmega3290A
Flash (kbytes)
32 Kbytes
Pin Count
100
Max. Operating Frequency
20 MHz
Cpu
8-bit AVR
# Of Touch Channels
16
Hardware Qtouch Acquisition
No
Max I/o Pins
69
Ext Interrupts
32
Usb Speed
No
Usb Interface
No
Spi
2
Twi (i2c)
1
Uart
1
Segment Lcd
160
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
15
Analog Comparators
1
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
2
Eeprom (bytes)
1024
Self Program Memory
YES
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8 to 5.5
Operating Voltage (vcc)
1.8 to 5.5
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
4
Input Capture Channels
1
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
Yes
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25. JTAG Interface and On-chip Debug System
25.1
25.2
25.3
8284D–AVR–6/11
Features
Overview
TAP – Test Access Port
ATmega169A/PA/329A/PA/3290A/PA/649A/P/6490A/P
•
•
•
•
•
•
The AVR IEEE std. 1149.1 compliant JTAG interface can be used for
• Testing PCBs by using the JTAG Boundary-scan capability
• Programming the non-volatile memories, Fuses and Lock bits
• On-chip debugging
A brief description is given in the following sections. Detailed descriptions for Programming via
the JTAG interface, and using the Boundary-scan Chain can be found in the sections
ming via the JTAG Interface” on page 331
261, respectively. The On-chip Debug support is considered being private JTAG instructions,
and distributed within ATMEL and to selected third party vendors only.
Figure 25-1 on page 256
system. The TAP Controller is a state machine controlled by the TCK and TMS signals. The TAP
Controller selects either the JTAG Instruction Register or one of several Data Registers as the
scan chain (Shift Register) between the TDI – input and TDO – output. The Instruction Register
holds JTAG instructions controlling the behavior of a Data Register.
The ID-Register, Bypass Register, and the Boundary-scan Chain are the Data Registers used
for board-level testing. The JTAG Programming Interface (actually consisting of several physical
and virtual Data Registers) is used for serial programming via the JTAG interface. The Internal
Scan Chain and Break Point Scan Chain are used for On-chip debugging only.
The JTAG interface is accessed through four of the AVR’s pins. In JTAG terminology, these pins
constitute the Test Access Port – TAP. These pins are:
• TMS: Test mode select. This pin is used for navigating through the TAP-controller state
• TCK: Test Clock. JTAG operation is synchronous to TCK.
machine.
JTAG (IEEE std. 1149.1 Compliant) Interface
Boundary-scan Capabilities According to the IEEE std. 1149.1 (JTAG) Standard
Debugger Access to:
Extensive On-chip Debug Support for Break Conditions, Including
Programming of Flash, EEPROM, Fuses, and Lock Bits through the JTAG Interface
On-chip Debugging Supported by AVR Studio
– All Internal Peripheral Units
– Internal and External RAM
– The Internal Register File
– Program Counter
– EEPROM and Flash Memories
– AVR Break Instruction
– Break on Change of Program Memory Flow
– Single Step Break
– Program Memory Break Points on Single Address or Address Range
– Data Memory Break Points on Single Address or Address Range
shows a block diagram of the JTAG interface and the On-chip Debug
and
®
”IEEE 1149.1 (JTAG) Boundary-scan” on page
”Program-
255
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