EP2S30F484C4 Altera, EP2S30F484C4 Datasheet - Page 127
EP2S30F484C4
Manufacturer Part Number
EP2S30F484C4
Description
IC STRATIX II FPGA 30K 484-FBGA
Manufacturer
Altera
Series
Stratix® IIr
Datasheet
1.EP2S15F484I4N.pdf
(238 pages)
Specifications of EP2S30F484C4
Number Of Logic Elements/cells
33880
Number Of Labs/clbs
1694
Total Ram Bits
1369728
Number Of I /o
342
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
484-FBGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Number Of Gates
-
Other names
544-1106
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EP2S30F484C4N
Manufacturer:
ALTERA
Quantity:
3 000
Part Number:
EP2S30F484C4N
Manufacturer:
ALTERA/阿尔特拉
Quantity:
20 000
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Figure 3–2. Temperature vs. Temperature-Sensing Diode Voltage
Automated
Single Event
Upset (SEU)
Detection
Altera Corporation
May 2007
(Across Diode)
Voltage
0.95
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
0.45
0.40
–55
The temperature-sensing diode works for the entire operating range, as
shown in
The temperature sensing diode is a very sensitive circuit which can be
influenced by noise coupled from other traces on the board, and possibly
within the device package itself, depending on device usage. The
interfacing device registers temperature based on milivolts of difference
as seen at the TSD. Switching I/O near the TSD pins can affect the
temperature reading. Altera recommends you take temperature readings
during periods of no activity in the device (for example, standby mode
where no clocks are toggling in the device), such as when the nearby I/Os
are at a DC state, and disable clock networks in the device.
Stratix II devices offer on-chip circuitry for automated checking of single
event upset (SEU) detection. Some applications that require the device to
operate error free at high elevations or in close proximity to Earth’s North
or South Pole require periodic checks to ensure continued data integrity.
The error detection cyclic redundancy check (CRC) feature controlled by
–30
Figure
3–2.
–5
Temperature (˚C)
20
45
Stratix II Device Handbook, Volume 1
70
100 μA Bias Current
10 μA Bias Current
Configuration & Testing
95
120
3–13
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