EP3SL150F1152C3N Altera, EP3SL150F1152C3N Datasheet - Page 409
![IC STRATX III FPGA 150K 1152FBGA](/photos/6/72/67293/544-1152-fbga_sml.jpg)
EP3SL150F1152C3N
Manufacturer Part Number
EP3SL150F1152C3N
Description
IC STRATX III FPGA 150K 1152FBGA
Manufacturer
Altera
Series
Stratix® IIIr
Datasheets
1.EP3SL150F780C4N.pdf
(16 pages)
2.EP3SL150F780C4N.pdf
(332 pages)
3.EP3SL150F780C4N.pdf
(456 pages)
Specifications of EP3SL150F1152C3N
Number Of Logic Elements/cells
142500
Number Of Labs/clbs
5700
Total Ram Bits
6390
Number Of I /o
744
Voltage - Supply
0.86 V ~ 1.15 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1152-FBGA
For Use With
544-2568 - KIT DEVELOPMENT STRATIX III
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Other names
544-2408
EP3SL150F1152C3NES
EP3SL150F1152C3NES
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EP3SL150F1152C3N
Manufacturer:
ALTERA
Quantity:
490
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Chapter 13: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Stratix III Devices
IEEE Std. 1149.1 BST Operation Control
SAMPLE/PRELOAD Instruction Mode
Figure 13–8. IEEE Std. 1149.1 BST SAMPLE/PRELOAD Mode
© July 2010
Capture Phase
In the capture phase, the
signals at the pin, OEJ and
OUTJ, are loaded into the
capture registers. The CLOCK
signals are supplied by the TAP
controller's CLOCKDR output.
The data retained in these
registers consists of signals
from normal device operation.
Shift and Update Phases
In the shift phase, the
previously captured signals at
the pin, OEJ and OUTJ, are
shifted out of the boundary-scan
register through the TDO pin using
CLOCK. As data is shifted out,
the patterns for the next test
can be shifted in through the
TDI pin.
In the update phase, data is
transferred from the capture
registers to the update
registers using the UPDATE
clock. The data stored in the
update registers can be used
for the EXTEST instruction.
Altera Corporation
The SAMPLE/PRELOAD instruction mode allows you to take a snapshot of device data
without interrupting normal device operation. However, this instruction is most often
used to preload the test data into the update registers prior to loading the EXTEST
instruction.
SAMPLE/PRELOAD mode.
Figure 13–8
OUTJ
OUTJ
OEJ
OEJ
SDI
SDI
shows the capture, shift, and update phases of the
0
1
0
1
0
1
0
1
0
1
0
1
SHIFT
SHIFT
CLOCK
CLOCK
Registers
D
D
D
Registers
Capture
D
D
D
Capture
Q
Q
Q
Q
Q
Q
SDO
SDO
UPDATE
UPDATE
D
D
D
Registers
D
D
D
Registers
Update
Update
Q
Q
Q
Q
Q
Q
0
1
0
1
0
1
0
1
0
1
0
1
Stratix III Device Handbook, Volume 1
MODE
MODE
PIN_IN
PIN_IN
INJ
INJ
13–11
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