EP1C3T144C6N Altera, EP1C3T144C6N Datasheet - Page 63

IC CYCLONE FPGA 2910 LE 144-TQFP

EP1C3T144C6N

Manufacturer Part Number
EP1C3T144C6N
Description
IC CYCLONE FPGA 2910 LE 144-TQFP
Manufacturer
Altera
Series
Cyclone®r
Datasheet

Specifications of EP1C3T144C6N

Number Of Logic Elements/cells
2910
Number Of Labs/clbs
291
Total Ram Bits
59904
Number Of I /o
104
Voltage - Supply
1.425 V ~ 1.575 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
144-TQFP, 144-VQFP
Family Name
Cyclone®
Number Of Logic Blocks/elements
2910
# I/os (max)
104
Frequency (max)
405.2MHz
Process Technology
0.13um (CMOS)
Operating Supply Voltage (typ)
1.5V
Logic Cells
2910
Ram Bits
59904
Operating Supply Voltage (min)
1.425V
Operating Supply Voltage (max)
1.575V
Operating Temp Range
0C to 85C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
144
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Number Of Gates
-
Lead Free Status / Rohs Status
Compliant
Other names
544-1662

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IEEE Std. 1149.1
(JTAG) Boundary
Scan Support
Altera Corporation
May 2008
SAMPLE
EXTEST
BYPASS
C51003-1.4
Table 3–1. Cyclone JTAG Instructions (Part 1 of 2)
JTAG Instruction
/
PRELOAD
(1)
00 0000 0101
00 0000 0000
11 1111 1111
Instruction Code
All Cyclone
IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan testing can be
performed either before or after, but not during configuration. Cyclone
devices can also use the JTAG port for configuration together with either
the Quartus
Byte-Code Files (.jbc).
Cyclone devices support reconfiguring the I/O standard settings on the
IOE through the JTAG BST chain. The JTAG chain can update the I/O
standard for all input and output pins any time before or during user
mode. Designers can use this ability for JTAG testing before configuration
when some of the Cyclone pins drive or receive from other devices on the
board using voltage-referenced standards. Since the Cyclone device
might not be configured before JTAG testing, the I/O pins might not be
configured for appropriate electrical standards for chip-to-chip
communication. Programming those I/O standards via JTAG allows
designers to fully test I/O connection to other devices.
The JTAG pins support 1.5-V/1.8-V or 2.5-V/3.3-V I/O standards. The
TDO pin voltage is determined by the V
The bank V
3.3-V compatible.
Cyclone devices also use the JTAG port to monitor the operation of the
device with the SignalTap
support the JTAG instructions shown in
CCIO
®
®
Allows a snapshot of signals at the device pins to be captured and
examined during normal device operation, and permits an initial
data pattern to be output at the device pins. Also used by the
SignalTap II embedded logic analyzer.
Allows the external circuitry and board-level interconnects to be
tested by forcing a test pattern at the output pins and capturing test
results at the input pins.
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation.
devices provide JTAG BST circuitry that complies with the
II software or hardware using either Jam Files (.jam) or Jam
selects whether the JTAG inputs are 1.5-V, 1.8-V, 2.5-V, or
3. Configuration and Testing
®
II embedded logic analyzer. Cyclone devices
Description
CCIO
Table
of the bank where it resides.
3–1.
Preliminary
3–1

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