AD5415YRU Analog Devices Inc, AD5415YRU Datasheet - Page 7

• Manufacturer Part Number: AD5415YRU
• Description: IC DAC DUAL 12BIT MULT 24-TSSOP
• Manufacturer: Analog Devices Inc

Specifications of AD5415YRU

• Settling Time: 120ns
• Number Of Bits: 12
• Data Interface: Serial
• Number Of Converters: 2
• Voltage Supply Source: Single Supply
• Power Dissipation (max): 3.5µW
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Package / Case: 24-TSSOP
• For Use With: EVAL-AD5415EBZ - BOARD EVALUATION FOR AD5415
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

ABSOLUTE MAXIMUM RATINGS
Transient currents of up to 100 mA do not cause SCR latch-up.
T
Table 3.
Parameter
V
V
I
Input Current to Any Pin Except Supplies
Logic Inputs and Output
Operating Temperature Range
Storage Temperature Range
Junction Temperature
24-Lead TSSOP, θ
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature (<20 sec)
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
OUT
Overvoltages at SCLK, SYNC , and SDIN are clamped by internal diodes.
DD
REF
A
Extended (Y Version)
= 25°C, unless otherwise noted.
1, I
, R
to GND
FB
OUT
to GND
2 to GND
JA
Thermal Impedance
1
−12 V to +12 V
−40°C to +125°C
−65°C to +150°C
Rating
−0.3 V to +7 V
−0.3 V to +7 V
±10 mA
−0.3 V to V
150°C
128°C/W
300°C
235°C
DD
+ 0.3 V
Rev. B | Page 7 of 32
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD5415