ADC12048CIV/NOPB National Semiconductor, ADC12048CIV/NOPB Datasheet - Page 9

• Manufacturer Part Number: ADC12048CIV/NOPB
• Description: IC ADC 12BIT+SIGN 8-CH 44-PLCC
• Manufacturer: National Semiconductor

Specifications of ADC12048CIV/NOPB

• Number Of Bits: 12
• Sampling Rate (per Second): 216k
• Data Interface: Parallel
• Number Of Converters: 1
• Power Dissipation (max): 875mW
• Voltage Supply Source: Analog and Digital
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 44-LCC (J-Lead)
• Leaded Process Compatible: Yes
• Rohs Compliant: Yes
• Peak Reflow Compatible (260 C): Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Other names: *ADC12048CIV; *ADC12048CIV/NOPB; ADC12048CIV

Notes on Specifications
Note 7: V
conversion/comparison accuracy. Refer to the Power Supply Considerations section for a detailed discussion.
Note 8: Accuracy is guaranteed when operating at f
Note 9: With the test condition for V
Note 10: Typicals are at T
Note 11: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 12: Positive integral linearity error is defined as the deviation of the analog value, expressed in LSBs, from the straight line that passes through positive
full-scale and zero. For negative integral linearity error, the straight line passes through negative full-scale and zero.
Note 13: Zero error is a measure of the deviation from the mid-scale voltage (a code of zero), expressed in LSB. It is the average value of the code transitions
between −1 to 0 and 0 to +1 (see Figure 8).
Note 14: The DC common-mode error is measured with both inputs shorted together and driven from 0V to 5V. The measured value is referred to the resulting
output value when the inputs are driven with a 2.5V input.
Note 15: Power Supply Sensitivity is measured after an Auto-Zero and Auto Calibration cycle has been completed with V
Note 16: V
Note 17: The ADC12048’s self-calibration technique ensures linearity and offset errors as specified, but noise inherent in the self-calibration process will result in
a repeatability uncertainly of
Note 18: Total Unadjusted Error (TUE) includes offset, full scale linearity and MUX errors.
Note 19: The ADC12048 parts used to gather the information for these curves were auto-calibrated prior to taking the measurements at each test condition. The
auto-calibration cycle cancels any first order drifts due to test conditions. However, each measurement has a repeatability uncertainty error of 0.2 LSB. See (Note
17).
Note 20: The reference input current is a DC average current drawn by the reference input with a full-scale sinewave input. The ADC12048 is continuously
converting with a throughput rate of 206 kHz.
Note 21: These typical curves were measured during continuous conversions with a positive half-scale DC input. A 240 ns RD pulse was applied 25 ns after the
RDY signal went low. The data bus lines were loaded with 2 HC family CMOS inputs (C
Note 22: Any other values placed in the command field are meaningless. However, if a code of 101 or 110 is placed in the command field and the CS, RD and WR
go low at the same time, the ADC12048 will enter a test mode. These test modes are only to be used by the manufacturer of this device. A hardware power-off and
power-on reset must be done to get out of these test modes.
A
+ and V
REFCM
(Reference Voltage Common Mode Range) is defined as
D
+ must be connected together to the same power supply voltage and bypassed with separate capacitors at each V
A
= 25˚C and represent most likely parametric norm.
±
0.20 LSB.
REF
(V
REF
+ − V
CLK
REF
(Continued)
−) given as +4.096V, the 12-bit LSB is 1.000 mV.
= 12 MHz.
9
L
∼ 20 pF).
01238704
A
+ and V
D
+ at the specified extremes.
+
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