7902401JA QP SEMICONDUCTOR, 7902401JA Datasheet - Page 5

• Manufacturer Part Number: 7902401JA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 7902401JA

• Lead Free Status / RoHS Status: Not Compliant

DSCC FORM 2234
APR 97
Appendix A.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
each lot of microcircuits delivered to this drawing.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
prior to quality conformance inspection. The following additional criteria shall apply:
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
3.5.1 Certification/compliance mark. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535,
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing..
3.9 Verification and review. DSCC, DSCC's agent and the acquiring activity retain the option to review the manufacturer's
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
4.3.1 Group A inspection.
DEFENSE SUPPLY CENTER COLUMBUS
a. Burn-in test (method 1015 of MIL-STD-883).
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C
d. Unprogrammed devices shall be tested for programmability and ac performance compliance to the requirements of
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
(1)
(2)
may affect input capacitance.
group A, subgroups 9. 10, and 11. Either of two techniques is acceptable:
(1)
(2)
tests prior to burn-in are optional at the discretion of the manufacturer.
COLUMBUS, OHIO 43218-3990
MICROCIRCUIT DRAWING
Testing the entire lot using additional built-in test circuitry which allows the manufacturer to verify programmability
and ac performance without programming the user array. If this is done, the resulting test patterns shall be verified
on all devices during subgroups 9, 10, and 11, group A testing per the sampling plan specified in MIL-STD-883,
method 5005.
If such compliance cannot be tested on an unprogrammed device, a sample shall be selected to satisfy
programmability requirements prior to performing subgroups 9, 10, and 11. Twelve devices shall be submitted to
programming. If more than 2 devices fail to program, the lot shall be rejected. At the manufacturer's option, the
sample may be increased to 24 total devices with no more than 4 total device failures allowable. Ten devices from
the programmability sample shall be submitted to the requirements of group A, subgroups 9, 10, and 11. If more
than 2 total devices fail, the lot shall be rejected. At the manufacturer's option, the sample may be increased to 20
total devices with no more than 4 total device failures allowable.
Test condition C, D or E. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or procuring activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
T
A
= +125°C, minimum.
STANDARD
IN
measurement) shall be measured only for the initial test and after process or design changes which
SIZE
A
REVISION LEVEL
C
SHEET
79024
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