TXC-03305AIPQ Transwitch Corporation, TXC-03305AIPQ Datasheet - Page 58
TXC-03305AIPQ
Manufacturer Part Number
TXC-03305AIPQ
Description
Manufacturer
Transwitch Corporation
Datasheet
1.TXC-03305AIPQ.pdf
(106 pages)
Specifications of TXC-03305AIPQ
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TXC-03305-MB
Ed. 4, September 2000
M13X
TXC-03305
BYPASS Test Instruction:
When the BYPASS instruction is shifted in, the M13X device remains fully operational. While in this test mode,
a scan operation will transfer serial data from the TDI input, through an internal scan cell, to the TDO lead. The
purpose of this instruction is to abbreviate the scan path through the circuits that are not being tested to only a
single clock delay.
Note: Lead locations are shown for illustration only, and do not correspond to the physical device leads.
TDI
Figure 25. Boundary Scan Schematic
Boundary Scan Register
Test Data Registers
Instruction Register
IN
TAP Controller
TCK TMS
Serial Test Data
Boundary Scan
Control Leads
DEVICE
DATA SHEET
LOGIC
CORE
M13X
OF
TRS
- 58 -
OUT
TDO
of PBGA package)
Signal input and
(solder balls on
bottom surface
output leads
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