AD5235BRUZ250-R7 Analog Devices Inc, AD5235BRUZ250-R7 Datasheet - Page 8

• Manufacturer Part Number: AD5235BRUZ250-R7
• Description: IC,Digital Potentiometer,CMOS,TSSOP,16PIN,PLASTIC
• Manufacturer: Analog Devices Inc

Specifications of AD5235BRUZ250-R7

• Taps: 1024
• Resistance (ohms): 250K
• Number Of Circuits: 2
• Temperature Coefficient: 35 ppm/°C Typical
• Memory Type: Non-Volatile
• Interface: 4-Wire SPI Serial
• Voltage - Supply: 3 V ~ 5.5 V, ±2.25 V ~ 2.75 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 16-TSSOP
• Resistance In Ohms: 250K
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• For Use With: EVAL-AD5235EBZ - BOARD EVALUATION FOR AD5235
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5235
ABSOLUTE MAXIMUM RATINGS
T
Table 3.
Parameter
V
V
V
V
I
Digital Input and Output Voltage to GND
Operating Temperature Range
Maximum Junction Temperature (T
Storage Temperature Range
Lead Temperature, Soldering
Thermal Resistance
Package Power Dissipation
1
2
A
Maximum terminal current is bounded by the maximum current handling of
the switches, maximum power dissipation of the package, and maximum
applied voltage across any two of the A, B, and W terminals at a given
resistance.
Includes programming of nonvolatile memory.
DD
SS
DD
A
A
, I
, V
Pulsed
Continuous
Vapor Phase (60 sec)
Infrared (15 sec)
Junction-to-Ambient θ
Junction-to-Case θ
= 25°C, unless otherwise noted.
B
to GND
to GND
to V
, I
B
, V
W
W
SS
1
to GND
JC
, TSSOP-16
JA
,TSSOP-16
2
J
max)
Rating
–0.3 V to +7 V
+0.3 V to −7 V
7 V
V
±20 mA
±2 mA
−0.3 V to V
−40°C to +85°C
150°C
−65°C to +150°C
215°C
220°C
150°C/W
28°C/W
(T
SS
J
max − T
− 0.3 V to V
DD
A
)/θ
+ 0.3 V
DD
JA
Rev. D | Page 8 of 32
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION