NTE2104 NTE ELECTRONICS, NTE2104 Datasheet

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NTE2104

Manufacturer Part Number
NTE2104
Description
IC, DRAM, 4KBIT, DIP-16
Manufacturer
NTE ELECTRONICS
Datasheet

Specifications of NTE2104

Memory Type
DRAM - NMOS
Memory Configuration
4K X 1
Access Time
200ns
Page Size
4Kbit
Memory Case Style
DIP
No. Of Pins
16
Operating Temperature Range
0°C To +70°C
Termination Type
Through Hole
Filter Terminals
Through Hole
Description:
The NTE21256 is a 262,144 word by 1–bit dynamic Random Access Memory. This 5V–only component
is fabricated with N–channel silicon gate technology.
Nine multiplexed address inputs permit the NTE21256 to be packaged in an industry standard
16–Lead DIP package. Features of this device include single power supply with 10% tolerance, on–
chip address, date registers which eliminate the need for interface registers, and fully TTL compatible
inputs and outputs, including clocks.
In addition to the usual read, write, and read–modify–write cycles, the NTE21256 is capable of early
and late write cycles, RAS–only refresh, and hidden refresh. Common I/O capability is given by using
early write operation.
The NTE21256 also features page mode which allows high–speed random access of bits in the same
row.
Features:
D 262,144 x 1–Bit Organization
D Single +5V Supply, 10% Tolerance
D Low Power Dissipation:
D Access Time: 150ns
D Cycle Time: 260ns
D All Inputs and Outputs TTL Compatible
D On–Chip Substrate Bias Generator
D Three–State Data Output
D Read, Write, Read–Modify–Write, RAS–Only–Refresh, Hidden Refresh
D Common I/O Capability using “Early Write” Operation
D Page Mode Read and Write, Read–Write
D 256 Refresh Cycles with 4ms Refresh Period
Absolute Maximum Ratings: (Note 1)
Operating Temperature Range, T
Storage Temperature Range, T
Voltage on any pin relative to V
Power Dissipation, P
Data Out Current (Short Circuit)
Note 1. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
–385mW active (Max)
–28mW standby (Max)
D
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262,144–Bit Dynamic Random
stg
SS
Access Memory (DRAM)
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opr
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NTE21256
–65 to +150 C
0 to +70 C
–1 to +7V
50mA
1W

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NTE2104 Summary of contents

Page 1

Description: The NTE21256 is a 262,144 word by 1–bit dynamic Random Access Memory. This 5V–only component is fabricated with N–channel silicon gate technology. Nine multiplexed address inputs permit the NTE21256 to be packaged in an industry standard 16–Lead DIP package. ...

Page 2

Device Initialization Since the NTE21256 is a dynamic RAM with a single +5V supply, no power sequencing is required. For power–up, an initial pause of 200 s is necessary for the internal bias generator to establish the proper substrate bias ...

Page 3

DC Characteristics + Parameter Input High Voltage (All Inputs) Input Low Voltage (All Inputs) Output High Voltage Output Low Voltage Average V Supply Current CC Standby V Supply Current CC Average V Supply ...

Page 4

AC Characteristics + otherwise specified) Parameter Random Read or Write Cycle Time Read–Modify–Write Cycle Time Access Time from RAS Access Time from CAS RAS Pulse Width CAS Pulse Width Refresh Period RAS Precharge ...

Page 5

AC Characteristics (Cont’d): (T Parameter Write Command Setup Time Write Command Hold Time Write Command Hold Time referenced to RAS Write Command Pulse Width Write Command to RAS Lead Time Write Command to CAS Lead Time Data in Setup Time ...

Page 6

RAS .785 (19.9) Max .245 (6.22) Min .100 (2.54) .700 (17.7) Pin Connection Diagram CAS ...

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