IDT82P5088BBG IDT, Integrated Device Technology Inc, IDT82P5088BBG Datasheet - Page 60

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IDT82P5088BBG

Manufacturer Part Number
IDT82P5088BBG
Description
IC LIU T1/E1/J1 OCTAL 256PBGA
Manufacturer
IDT, Integrated Device Technology Inc
Datasheet

Specifications of IDT82P5088BBG

Includes
Integrated Clock Adapter
Function
Line Interface Unit (LIU)
Interface
E1, J1, T1
Number Of Circuits
8
Voltage - Supply
1.8V, 3.3V
Power (watts)
2.57W
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
256-BBGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Current - Supply
-

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5
described in the IEEE 1149.1 standards.
ters plus a Test Access Port (TAP) controller. Control of the TAP is per-
formed through signals applied to the Test Mode Select (TMS) and Test
Clock (TCK) pins. Data is shifted into the registers via the Test Data Input
IEEE STD 1149.1 JTAG TEST ACCESS PORT
IDT82P5088
The IDT82P5088 supports the digital Boundary Scan Specification as
The boundary scan architecture consists of data and instruction regis-
IEEE STD 1149.1 JTAG TEST ACCESS PORT
TRST
TDI
TCK
TMS
parallel latched output
Digital output pins
(Test Access Port)
Controller
IDR (Device Identification Register)
TAP
BSR (Boundary Scan Register)
IR (Instruction Register)
BR (Bypass Register)
Figure-23 JTAG Architecture
UNIVERSAL OCTAL T1/E1/J1 LIU WITH INTEGRATED CLOCK ADAPTER
Control<6:0>
Digital input pins
60
(TDI) pin, and shifted out of the registers via the Test Data Output (TDO)
pin. Both TDI and TDO are clocked at a rate determined by TCK.
ister), IDR (Device Identification Register), BR (Bypass Register) and IR
(Instruction Register). These will be described in the following pages. Refer
to for architecture.
The JTAG boundary scan registers include BSR (Boundary Scan Reg-
High Impedance Enable
Select
MUX
February 5, 2009
TDO

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