MC9S08GB60CFU Freescale Semiconductor, MC9S08GB60CFU Datasheet - Page 272
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MC9S08GB60CFU
Manufacturer Part Number
MC9S08GB60CFU
Description
IC MCU 60K FLASH 20MHZ 64-LQFP
Manufacturer
Freescale Semiconductor
Series
HCS08r
Datasheet
1.M68EVB908GB60E.pdf
(290 pages)
Specifications of MC9S08GB60CFU
Core Processor
HCS08
Core Size
8-Bit
Speed
40MHz
Connectivity
I²C, SCI, SPI
Peripherals
LVD, POR, PWM, WDT
Number Of I /o
56
Program Memory Size
60KB (60K x 8)
Program Memory Type
FLASH
Ram Size
4K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 8x10b
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
64-LQFP
For Use With
M68DEMO908GB60E - BOARD DEMO MC9S08GB60M68EVB908GB60E - BOARD EVAL FOR MC9S08GB60
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Eeprom Size
-
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Appendix A Electrical Characteristics
272
1
2
3
4
5
6
7
8
Output clock ICGOUT frequency
Minimum DCO clock (ICGDCLK) frequency
Maximum DCO clock (ICGDCLK) frequency
Self-clock mode (ICGOUT) frequency
Self-clock mode reset (ICGOUT) frequency
Loss of reference frequency
Loss of DCO frequency
Crystal start-up time
FLL lock time
FLL frequency unlock range
FLL frequency lock range
ICGOUT period jitter,
Internal oscillator deviation from trimmed frequency
Self-clocked mode frequency is the frequency that the DCO generates when the FLL is open-loop.
Loss of reference frequency is the reference frequency detected internally, which transitions the ICG into self-clocked
mode if it is not in the desired range.
Loss of DCO frequency is the DCO frequency detected internally, which transitions the ICG into FLL bypassed external
mode (if an external reference exists) if it is not in the desired range.
This parameter is characterized before qualification rather than 100% tested.
Proper PC board layout procedures must be followed to achieve specifications.
This specification applies to the period of time required for the FLL to lock after entering FLL engaged internal or external
modes. If a crystal/resonator is being used as the reference, this specification assumes it is already running.
Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum f
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V
percentage for a given interval.
See
CLKS = 10, REFS = 0
All other cases
Low range
High range
Low range
High range
Low range
High range
Long term jitter (averaged over 2 ms interval)
V
V
DD
DD
Figure A-10
= 1.8 – 3.6 V, (constant temperature)
= 3.0 V ±10%, –40° C to 85° C
4, 6
(V
DDA
Characteristic
4, 5
4, 7
= V
3
measured at f
DDA
2
Table A-9. ICG Frequency Specifications (continued)
(min) to V
DDA
1
ICGOUT
and V
MC9S08GB/GT Data Sheet, Rev. 2.3
DDA
Max
SSA
(max), Temperature Range = –40 to 85°C Ambient)
and variation in crystal oscillator frequency increase the C
8
f
f
ICGDCLKmax
ICGDCLKmin
f
Symbol
f
Self_reset
n
ACC
ICGOUT
t
t
C
t
n
t
CSTH
f
f
CSTL
Lockh
Unlock
f
Lockl
LOR
LOD
Self
Lock
Jitter
int
f
f
ICGDCLKmin
Extal
f
lo
–4*N
–2*N
Min
5.5
0.5
(min)
50
—
—
—
—
—
—
—
8
5
(min)
Typical
± 0.5
±0.5
430
—
—
8
4
Freescale Semiconductor
f
f
f
ICGDCLKmax
ICGDCLKmax
Extal
(max)
Max
10.5
500
4*N
2*N
1.5
0.2
40
25
±2
±2
—
—
2
2
(max)
Jitter
counts
counts
% f
ICGOUT
MHz
MHz
MHz
MHz
MHz
MHz
Unit
kHz
ms
ms
%
ICG
.
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