MC9S08LC36LH Freescale Semiconductor, MC9S08LC36LH Datasheet - Page 349

• Manufacturer Part Number: MC9S08LC36LH
• Description: IC MCU 36K FLASH 2K RAM 64-LQFP
• Manufacturer: Freescale Semiconductor
• Series: HCS08r

Specifications of MC9S08LC36LH

• Core Processor: HCS08
• Core Size: 8-Bit
• Speed: 40MHz
• Connectivity: I²C, SCI, SPI
• Peripherals: LCD, LVD, POR, PWM, WDT
• Number Of I /o: 18
• Program Memory Size: 36KB (36K x 8)
• Program Memory Type: FLASH
• Ram Size: 2.5K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 2x12b
• Oscillator Type: External
• Operating Temperature: 0°C ~ 70°C
• Package / Case: 64-LQFP
• Processor Series: S08LC
• Core: HCS08
• Data Bus Width: 8 bit
• Data Ram Size: 2.5 KB
• Interface Type: I2C/SCI/SPI1/SPI2
• Maximum Clock Frequency: 40 MHz
• Number Of Programmable I/os: 18
• Maximum Operating Temperature: + 85 C
• Mounting Style: SMD/SMT
• 3rd Party Development Tools: EWS08
• Minimum Operating Temperature: - 40 C
• On-chip Adc: 2-ch x 12-bit
• For Use With: DEMO9S08LC60 - BOARD DEMO FOR 9S08LC60
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Eeprom Size: -
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant

A.12.2
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient signal on each pin of the
microcontroller. The transient waveform and injection methodology is in accordance with IEC 61000-4-4
for the electrical fast transient/burst (EFT/B). The transient voltage required to cause performance
degradation on any pin in the tested configuration is greater than or equal to the reported levels unless
otherwise indicated by footnotes below the table.
The susceptibility performance classification is described in
Freescale Semiconductor
NOTES:
1. This data based on qualification test results. Not tested in production.
2. The reported transient immunity voltage ;levels indicate the minimum voltage range for each result type.
Package
80LQFP
Result
A
B
C
D
E
Conducted Transient Susceptibility
Voltage
Supply
Self-recovering
[V]
2.2
Hard failure
Soft failure
No failure
Table A-17. Conducted Transient Susceptibility Characteristics
Damage
failure
Table A-18. Susceptibility Performance Classification
Ambient
MC9S08LC60 Series Data Sheet: Technical Data, Rev. 4
Temp.
[
o
25
C]
The MCU performs as designed during and after exposure.
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.
External crystal,
Frequency
Oscillator
Source &
32 kHz
Performance Criteria
System Bus
Frequency
20 MHz
Table
A-18.
Result
C
D
A
B
E
Appendix A Electrical Characteristics
1
Amplitude
[Typical]
Level
none
none
none
none
+/- 4
2
Unit
kV
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