gvt71256d36 ETC-unknow, gvt71256d36 Datasheet - Page 16

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gvt71256d36

Manufacturer Part Number
gvt71256d36
Description
256k 36/512k Synchronous Sram
Manufacturer
ETC-unknow
Datasheet

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controller is placed in the test-logic reset state. When the TAP
controller is in the Capture-IR state, the two least significant
bits of the serial instruction register are loaded with a binary
“01“ pattern to allow for fault isolation of the board-level
serial test data path.
BYPASS REGISTE R
placed between TDI and TDO. It allows serial test data to be
passed through the device TAP to another device in the scan
chain with minimum delay. The bypass register is set LOW
(VSS) when the BYPASS instruction is executed.
BOUNDARY SCAN REGISTE R
and bidirectional I/O pins (not counting the TAP pins) on the
device. This also includes a number of NC pins that are
reserved for future needs. There are a total of 70 bits for x36
device and 51 bits for x18 device. The boundary scan register,
under the control of the TAP controller, is loaded with the
contents of the device I/O ring when the controller is in
Capture-DR state and then is placed between the TDI and
TDO pins when the controller is moved to Shift-DR state. The
EXTEST, SAMPLE/PRELOAD and SAMPLE-Z instructions
can be used to capture the contents of the I/O ring.
which the bits are connected. The first column defines the
bit’s position in the boundary scan register. The MSB of the
register is connected to TDI, and LSB is connected to TDO.
The second column is the signal name and the third column is
the bump number. The third column is the TQFP pin number
and the fourth column is the BGA bump number.
INDENTIFICATION (ID) REGISTE R
The ID Register is a 32-bit register that is loaded with a device
and vendor specific 32-bit code when the controller is put in
Capture-DR state with the IDCODE command loaded in the
instruction register. The register is then placed between the
TDI and TDO pins when the controller is moved into Shift-
DR state. Bit 0 in the register is the LSB and the first to reach
TDO when shifting begins. The code is loaded from a 32-bit
on-chip ROM. It describes various attributes of the device as
described in the Identification Register Definitions table.
May 18, 199 9
Rev. 5/99
GALVANTECH
The bypass register is a single-bit register that can be
The Boundary scan register is connected to all the input
The Boundary Scan Order table describes the order in
, INC.
256K X 36/512K X 18 SYNCHRONOUS SRAM
16
TAP CONTROLLER INSTRUCTION
SET
OVERWIEW
Standard 1149.1-1990; the standard (public) instructions and
device
instructions are mandatory for IEEE 1149.1 compliance.
Optional public instructions must be implemented in
prescribed ways.
IEEE 1149.1 conventions, it is not IEEE 1149.1 compliant
because some of the mandatory instructions are not fully
implemented. The TAP on this device may be used to monitor
all input and I/O pads, but can not be used to load address,
data, or control signals into the device or to preload the I/O
buffers. In other words, the device will not perform IEEE
1149.1 EXTEST, INTEST, or the preload portion of the
SAMPLE/PRELOAD command.
the two least significant bits of the instruction register are
loaded with 01. When the controller is moved to the Shift-IR
state the instruction is serially loaded through the TDI input
(while the previous contents are shifted out at TDO). For all
instructions, the TAP executes newly loaded instructions only
when the controller is moved to Update-IR state. The TAP
instruction sets for this device are listed in the following
tables.
EXTEST
instruction. It is to be executed whenever the instruction
register is loaded with all 0s. EXTEST is not implemented in
this device.
When an EXTEST instruction is loaded into the instruction
register, the device responds as if a SAMPLE/PRELOAD
instruction has been loaded. There is one difference between
two instructions. Unlike SAMPLE/PRELOAD instruction,
EXTEST places the device outputs in a High-Z state.
IDCODE
code to be loaded into the ID register when the controller is in
Capture-DR mode and places the ID register between the TDI
and TDO pins in Shift-DR mode. The IDCODE instruction is
the default instruction loaded in the instruction upon power-
up and at any time the TAP controller is placed in the test-
logic reset state.
There are two classes of instructions defined in the IEEE
Although the TAP controller in this device follows the
When the TAP controller is placed in Capture-IR state,
EXTEST is an IEEE 1149.1 mandatory public
The TAP controller does recognize an all-0 instruction.
The IDCODE instruction causes a vendor-specific, 32-bit
specific
GVT71256D36/GVT71512D18
Galvantech, Inc. reserves the right to change products or specifications without notice
(private)
instructions.
Some
public
.

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