FCD4B14CU Atmel, FCD4B14CU Datasheet - Page 5

• Manufacturer Part Number: FCD4B14CU
• Manufacturer: Atmel

Specifications of FCD4B14CU

• Lead Free Status / Rohs Status: Compliant

Table 5. Resistance
Table 6. Specifications
1962C–01/02
Parameter
ESD
On pins. HBM (Human Body Model) CMOS I/O
On die surface (Zapgun)
Air discharge
MECHANICAL ABRASION
Number of cycles without lubricant multiply by a
factor of 20 for correlation with a real finger
CHEMICAL RESISTANCE
Cleaning agent, acid, grease, alcohol, diluted
acetone
Explanation Of Test Levels
I
II
III
IV
V
VI
D
Parameter
Resolution
Size
Yield: number of bad pixels
Equivalent resistance on TPP pin
100% production tested at +25°C
100% production tested at +25°C, and sample tested at specified temperatures (AC testing done on sample)
Sample tested only
Parameter is guaranteed by design and/or characterization testing
Parameter is a typical value only
100% production tested at temperature extremes
100% probe tested on wafer at T
amb
= +25°C
Symbol
Min Value
2 kV
±16 kV
200 000
4 hours
Test Level
IV
IV
I
I
Min
23
8x280
Standard Method
MIL-STD-883- method 3015.7
NF EN 6100-4-2
MIL E 12397B
Internal method
Typ
50
30
Max
15
47
FCD4B14
bad pixels
micron
Unit
pixel
Ω
5