MPC562MZP56 Freescale Semiconductor, MPC562MZP56 Datasheet - Page 1085

IC MPU 32BIT 56MHZ PPC 388-PBGA

MPC562MZP56

Manufacturer Part Number
MPC562MZP56
Description
IC MPU 32BIT 56MHZ PPC 388-PBGA
Manufacturer
Freescale Semiconductor
Series
MPC5xxr
Datasheet

Specifications of MPC562MZP56

Core Processor
PowerPC
Core Size
32-Bit
Speed
56MHz
Connectivity
CAN, EBI/EMI, SCI, SPI, UART/USART
Peripherals
POR, PWM, WDT
Number Of I /o
64
Program Memory Type
ROMless
Ram Size
32K x 8
Voltage - Supply (vcc/vdd)
2.5 V ~ 2.7 V
Data Converters
A/D 32x10b
Oscillator Type
External
Operating Temperature
-40°C ~ 125°C
Package / Case
388-BGA
Processor Series
MPC5xx
Core
PowerPC
Data Bus Width
32 bit
Data Ram Size
8 KB
Interface Type
SCI, SPI, UART
Maximum Clock Frequency
40 MHz
Number Of Programmable I/os
56
Number Of Timers
22
Operating Supply Voltage
2.6 V to 5 V
Maximum Operating Temperature
+ 85 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 40 C
On-chip Adc
2 (10 bit, 32 Channel)
For Use With
MPC564EVB - KIT EVAL FOR MPC561/562/563/564
Lead Free Status / RoHS Status
Request inventory verification / Request inventory verification
Eeprom Size
-
Program Memory Size
-
Lead Free Status / Rohs Status
No

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During the capture-IR controller state, the parallel inputs to the instruction shift register are loaded with
the CLAMP command code.
25.1.3.1
The external test (EXTEST) instruction selects the 520-bit boundary scan register. EXTEST also asserts
internal reset for the MPC561/MPC563 system logic to force a predictable beginning internal state while
performing external boundary scan operations.
By using the TAP, the register is capable of:
25.1.3.2
The SAMPLE/PRELOAD instruction initializes the boundary scan register output cells prior to selection
of EXTEST. This initialization ensures that known data will appear on the outputs when entering the
EXTEST instruction. The SAMPLE/PRELOAD instruction also provides a means to obtain a snapshot of
system data and control signals.
25.1.3.3
The BYPASS instruction selects the single-bit bypass register as shown in
register path from TDI to the bypass register and, finally, to TDO, circumventing the 520-bit boundary
scan register. This instruction is used to enhance test efficiency when a component other than the
MPC561/MPC563 becomes the device under test.
When the bypass register is selected by the current instruction, the shift register stage is set to a logic zero
on the rising edge of TCK in the capture-DR controller state. Therefore, the first bit to be shifted out after
selecting the bypass register will always be a logic zero.
Freescale Semiconductor
a) scanning user-defined values into the output buffers
b) capturing values presented to input pins
c) controlling the output drive of three-state output or bidirectional pins
EXTEST
SAMPLE/PRELOAD
BYPASS
Since there is no internal synchronization between the scan chain clock
(TCK) and the system clock (CLKOUT), there must be provision of some
form of external synchronization to achieve meaningful results.
FROM TDI
SHIFT DR
0
MPC561/MPC563 Reference Manual, Rev. 1.2
Figure 25-5. Bypass Register
G1
1
1
Mux
NOTE
CLOCK DR
D
C
Figure
IEEE 1149.1-Compliant Interface (JTAG)
TO TDO
25-5. This creates a shift
25-31

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